A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source - Lin, Bohan; Pang, Yachuan; Gao, Bin; Tang, Jianshi; Wu, Dong; Chang, Ting-Wei; Lin, Wei-En; Sun, Xiaoyu; Yu, Shimeng; Chang, Meng-Fan; Qian, He; Wu, Huaqiang (IEEE journal of solid-state circuits, 2021)
Keywords: Amplifier design; Bit error rate; Device-to-device communication; Hardware; Hardware security; Internet of Things; Physical unclonable function; physical unclonable function (PUF); post-process randomness; Random access memory; reconfigurability; Reliability; Resistance; resistive random access memory (RRAM); Security; Sense amplifiers; Switches