A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have...

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Published inIEEE journal of solid-state circuits Vol. 56; no. 5; pp. 1641 - 1650
Main Authors Lin, Bohan, Pang, Yachuan, Gao, Bin, Tang, Jianshi, Wu, Dong, Chang, Ting-Wei, Lin, Wei-En, Sun, Xiaoyu, Yu, Shimeng, Chang, Meng-Fan, Qian, He, Wu, Huaqiang
Format Journal Article
LanguageEnglish
Published New York IEEE 01.05.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Amplifier design
Bit error rate
Device-to-device communication
Hardware
Hardware security
Internet of Things
Physical unclonable function
physical unclonable function (PUF)
post-process randomness
Random access memory
reconfigurability
Reliability
Resistance
resistive random access memory (RRAM)
Security
Sense amplifiers
Switches
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Abstract Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have demonstrated superior performance on reliability and integration density. In this work, a resistive random access memory (RRAM)-based PUF chip with 8-kb capacity is developed. Two operation modes, namely differential mode and median mode, are embedded on chip. To implement these modes, a current sampling-based sense amplifier is designed to distinguish the current values of the PUF cells and the reference cell. In addition, a split-resistance scheme is proposed to enhance the PUF's reliability significantly. The experiment results show that the differential PUF exhibits excellent performance with native bit error rate (N-BER) below 6 <inline-formula> <tex-math notation="LaTeX">\times </tex-math></inline-formula> 10 −6 and inter-Hamming distance (inter-HD) of 49.99%. In the meanwhile, the reconfigurability of PUF challenge-response pairs (CRPs) is demonstrated with 49.77% and 47.29% reconfigure-Hamming distance (reconfigure-HD) in the median mode and the differential mode, respectively.
AbstractList Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have demonstrated superior performance on reliability and integration density. In this work, a resistive random access memory (RRAM)-based PUF chip with 8-kb capacity is developed. Two operation modes, namely differential mode and median mode, are embedded on chip. To implement these modes, a current sampling-based sense amplifier is designed to distinguish the current values of the PUF cells and the reference cell. In addition, a split-resistance scheme is proposed to enhance the PUF's reliability significantly. The experiment results show that the differential PUF exhibits excellent performance with native bit error rate (N-BER) below 6 <inline-formula> <tex-math notation="LaTeX">\times </tex-math></inline-formula> 10 −6 and inter-Hamming distance (inter-HD) of 49.99%. In the meanwhile, the reconfigurability of PUF challenge-response pairs (CRPs) is demonstrated with 49.77% and 47.29% reconfigure-Hamming distance (reconfigure-HD) in the median mode and the differential mode, respectively.
Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have demonstrated superior performance on reliability and integration density. In this work, a resistive random access memory (RRAM)-based PUF chip with 8-kb capacity is developed. Two operation modes, namely differential mode and median mode, are embedded on chip. To implement these modes, a current sampling-based sense amplifier is designed to distinguish the current values of the PUF cells and the reference cell. In addition, a split-resistance scheme is proposed to enhance the PUF’s reliability significantly. The experiment results show that the differential PUF exhibits excellent performance with native bit error rate (N-BER) below 6 [Formula Omitted] 10−6 and inter-Hamming distance (inter-HD) of 49.99%. In the meanwhile, the reconfigurability of PUF challenge-response pairs (CRPs) is demonstrated with 49.77% and 47.29% reconfigure-Hamming distance (reconfigure-HD) in the median mode and the differential mode, respectively.
Author Lin, Bohan
Qian, He
Tang, Jianshi
Sun, Xiaoyu
Yu, Shimeng
Pang, Yachuan
Chang, Meng-Fan
Gao, Bin
Chang, Ting-Wei
Lin, Wei-En
Wu, Dong
Wu, Huaqiang
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Snippet Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the...
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SubjectTerms Amplifier design
Bit error rate
Device-to-device communication
Hardware
Hardware security
Internet of Things
Physical unclonable function
physical unclonable function (PUF)
post-process randomness
Random access memory
reconfigurability
Reliability
Resistance
resistive random access memory (RRAM)
Security
Sense amplifiers
Switches
Title A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source
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