A Novel Weakly Supervised Ensemble Learning Framework for Automated Pixel-Wise Industry Anomaly Detection - Mei, Shuang; Cheng, Jiangtao; He, Xin; Hu, Hao; Wen, Guojun (IEEE sensors journal, 2022)
Keywords: Anomalies; Anomaly detection; Artificial neural networks; Automation; Convolution; Data models; Datasets; Ensemble learning; Feature extraction; Image segmentation; Inspection; machine vision; Pixels; semantic segmentation; Sensors; Training; weakly supervised