Cai, J., King, J., Yu, C., Liu, J., & Sun, L. (2018). Support Vector Regression-Based Behavioral Modeling Technique for RF Power Transistors. IEEE microwave and wireless components letters, 28(5), 428-430. https://doi.org/10.1109/LMWC.2018.2819427
Chicago Style (17th ed.) CitationCai, Jialin, Justin King, Chao Yu, Jun Liu, and Lingling Sun. "Support Vector Regression-Based Behavioral Modeling Technique for RF Power Transistors." IEEE Microwave and Wireless Components Letters 28, no. 5 (2018): 428-430. https://doi.org/10.1109/LMWC.2018.2819427.
MLA (9th ed.) CitationCai, Jialin, et al. "Support Vector Regression-Based Behavioral Modeling Technique for RF Power Transistors." IEEE Microwave and Wireless Components Letters, vol. 28, no. 5, 2018, pp. 428-430, https://doi.org/10.1109/LMWC.2018.2819427.