Li, X., Gao, B., Liu, Z., & Tian, G. Y. (2020). Microcracks Detection Based on Shuttle-Shaped Electromagnetic Thermography. IEEE sensors journal, 20(21), 12961-12971. https://doi.org/10.1109/JSEN.2020.3001305
Chicago Style (17th ed.) CitationLi, Xiaofeng, Bin Gao, Zewei Liu, and Gui Yun Tian. "Microcracks Detection Based on Shuttle-Shaped Electromagnetic Thermography." IEEE Sensors Journal 20, no. 21 (2020): 12961-12971. https://doi.org/10.1109/JSEN.2020.3001305.
MLA (9th ed.) CitationLi, Xiaofeng, et al. "Microcracks Detection Based on Shuttle-Shaped Electromagnetic Thermography." IEEE Sensors Journal, vol. 20, no. 21, 2020, pp. 12961-12971, https://doi.org/10.1109/JSEN.2020.3001305.
Warning: These citations may not always be 100% accurate.