Ultrahigh-Sensitivity Microwave Sensor for Microfluidic Complex Permittivity Measurement

The conventional resonant-type microwave microfluidic sensors made of planar resonators suffer from limited sensitivities. This is due to the existence of several distributed capacitors in their structure, where just one of them acts as a sensing element. This article proposes a very high-sensitivit...

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Bibliographic Details
Published inIEEE transactions on microwave theory and techniques Vol. 67; no. 10; pp. 4269 - 4277
Main Authors Ebrahimi, Amir, Scott, James, Ghorbani, Kamran
Format Journal Article
LanguageEnglish
Published New York IEEE 01.10.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract The conventional resonant-type microwave microfluidic sensors made of planar resonators suffer from limited sensitivities. This is due to the existence of several distributed capacitors in their structure, where just one of them acts as a sensing element. This article proposes a very high-sensitivity microwave sensor made of a microstrip transmission line loaded with a shunt-connected series LC resonator. A large sensitivity for dielectric loadings is achieved by incorporating just one capacitor in the resonator structure. Applying sample liquids to the microfluidic channel implemented in the capacitive gap area of the sensor modifies the capacitor value. This is translated to a resonance frequency shift from which the liquid sample is characterized. The sensor performance and working principle are described through a circuit model analysis. Finally, a device prototype is fabricated, and experimental measurements using water/ethanol solutions are presented for verification of the sensing principle.
AbstractList The conventional resonant-type microwave microfluidic sensors made of planar resonators suffer from limited sensitivities. This is due to the existence of several distributed capacitors in their structure, where just one of them acts as a sensing element. This article proposes a very high-sensitivity microwave sensor made of a microstrip transmission line loaded with a shunt-connected series LC resonator. A large sensitivity for dielectric loadings is achieved by incorporating just one capacitor in the resonator structure. Applying sample liquids to the microfluidic channel implemented in the capacitive gap area of the sensor modifies the capacitor value. This is translated to a resonance frequency shift from which the liquid sample is characterized. The sensor performance and working principle are described through a circuit model analysis. Finally, a device prototype is fabricated, and experimental measurements using water/ethanol solutions are presented for verification of the sensing principle.
Author Ebrahimi, Amir
Ghorbani, Kamran
Scott, James
Author_xml – sequence: 1
  givenname: Amir
  orcidid: 0000-0002-1787-2230
  surname: Ebrahimi
  fullname: Ebrahimi, Amir
  email: amir.ebrahimi@rmit.edu.au
  organization: School of Engineering, Royal Melbourne Institute of Technology (RMIT University), Melbourne, VIC, Australia
– sequence: 2
  givenname: James
  orcidid: 0000-0003-3200-6821
  surname: Scott
  fullname: Scott, James
  organization: School of Engineering, Royal Melbourne Institute of Technology (RMIT University), Melbourne, VIC, Australia
– sequence: 3
  givenname: Kamran
  orcidid: 0000-0001-8767-0207
  surname: Ghorbani
  fullname: Ghorbani, Kamran
  organization: School of Engineering, Royal Melbourne Institute of Technology (RMIT University), Melbourne, VIC, Australia
BookMark eNp9kF1LwzAUhoNMcJv-APGm4HVn0iRNcinDL9hQsAPvSpqeuox-zDSd7t_bOvXCCy8O4RzOkzd5JmhUNzUgdE7wjBCsrpJlkswiTNQsUjQSVByhMeFchCoWeITGGBMZKibxCZq07aZvGcdyjF5WpXd6bV_X4TPUrfV2Z_0-WFrjmne9g2CYNi4o-voaFmVnc2uCeVNtS_gInsBV1v9goNvOQQW1P0XHhS5bOPs-p2h1e5PM78PF493D_HoRmv6hPiQmiiMW0zyLlWESIqoylRlQYARwHkvDsxgzwJgpqXKuhRSq0CLTRpm80HSKLg_3bl3z1kHr003TubqPTCOKqWIKM9lvkcNW_4O2dVCkW2cr7fYpwekgMB0EpoPA9Ftgz4g_jLFee9vUvTFb_kteHEgLAL9JUmIlKKefOYeCGg
CODEN IETMAB
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TMTT.2019.2932737
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList Technology Research Database

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1557-9670
EndPage 4277
ExternalDocumentID 10_1109_TMTT_2019_2932737
8809735
Genre orig-research
GroupedDBID -~X
.GJ
0R~
29I
3EH
4.4
5GY
5VS
66.
6IK
85S
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
RXW
TAE
TAF
TN5
VH1
VJK
VOH
AAYXX
CITATION
RIG
7SP
8FD
L7M
ID FETCH-LOGICAL-c293t-1c262463db69c48e239b9bce9ec7e5568c5b604e004989d5a7879fa7bac9cdfa3
IEDL.DBID RIE
ISSN 0018-9480
IngestDate Mon Jun 30 10:10:52 EDT 2025
Tue Jul 01 02:00:14 EDT 2025
Thu Apr 24 22:49:15 EDT 2025
Wed Aug 27 02:43:03 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 10
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c293t-1c262463db69c48e239b9bce9ec7e5568c5b604e004989d5a7879fa7bac9cdfa3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0003-3200-6821
0000-0001-8767-0207
0000-0002-1787-2230
PQID 2303949048
PQPubID 106035
PageCount 9
ParticipantIDs ieee_primary_8809735
proquest_journals_2303949048
crossref_primary_10_1109_TMTT_2019_2932737
crossref_citationtrail_10_1109_TMTT_2019_2932737
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2019-10-01
PublicationDateYYYYMMDD 2019-10-01
PublicationDate_xml – month: 10
  year: 2019
  text: 2019-10-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on microwave theory and techniques
PublicationTitleAbbrev TMTT
PublicationYear 2019
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0014508
Score 2.6729689
Snippet The conventional resonant-type microwave microfluidic sensors made of planar resonators suffer from limited sensitivities. This is due to the existence of...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 4269
SubjectTerms Capacitors
Circuits
Complex permittivity
Dielectric measurement
Ethanol
Frequency shift
Integrated circuit modeling
microfluidic sensor
Microfluidics
Microstrip
Microstrip transmission lines
microwave sensor
Microwave sensors
planar resonators
Resonators
Sensitivity
Sensors
Transmission lines
Title Ultrahigh-Sensitivity Microwave Sensor for Microfluidic Complex Permittivity Measurement
URI https://ieeexplore.ieee.org/document/8809735
https://www.proquest.com/docview/2303949048
Volume 67
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEB6sJz34FuuLPXgSt9022c3OUUQRoSLYQm9Lkp2FYmmlblX89U72UZ-IlyWEZAnzzCRfZgBOFBqR8ccXxsa-jETma7aVfoaBIZMqpYtk1b3b6Hogb4bhcAnOFm9hiKgAn1HLNYu7_HRq5-6orM2yhkqEDWhw4Fa-1VrcGMgwqKwuK7CM6xvMToDtfq_fdyAubLFvY3etvvigoqjKD0tcuJerdejVCytRJQ-teW5a9u1bzsb_rnwD1qp9pndeCsYmLNFkC1Y_ZR_chuFgnLOp4ejcv3cw9rKOhNdzEL0X_Uye653OPN7Wlp3ZeD5KR9ZzNmRMr96dA9Lk9bSPw8YdGFxd9i-u_arQgm-ZIrnfsd2oy3xKTYRWxtQVaNBYQrKKXIoyG5ookOTCiRjTULOWY6aV0RZtmmmxC8uT6YT2wENNJlMy7pqYpMgiDJW0AsNQ8dBIUxOCmvSJrbKQu2IY46SIRgJMHLcSx62k4lYTThdTHssUHH8N3nbUXwysCN-Ew5q_SaWkTwlHXwIlsg3b_33WAay4f5fYvUNYzmdzOuI9SG6OC-F7B5yk2lg
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB5Remg50FKoWKCQQ08VWbJrO84cUVW0PIKQyEp7i2xnIiFWuxVkacWvZ5zHltKq6iWyLFux5umxP88AfNZoRcmfUFiXhDIWZWjYVoYlRpZsobWpk1Wnl_FoLM8marICh8u3MERUg8-o75v1XX4xdwt_VHbEsoZaqFfwmv2-GjSvtZZ3BlJFrd1lFZZJd4c5iPAoS7PMw7iwz96NHbb-zQvVZVX-sMW1gzl5B2m3tAZXcttfVLbvHl9kbfzftb-H9XanGRw3orEBKzT7AGvP8g9uwmQ8rdjYcHweXnsge1NJIkg9SO-HeaDA987vAt7YNp3ldHFT3LjAW5Ep_QyuPJSm6qb9Om7cgvHJt-zrKGxLLYSOKVKFAzeMh8ypwsboZEJDgRatIySnyScpc8rGkSQfUCRYKMN6jqXR1jh0RWnER1idzWe0DQEasqWWydAmJEUZo9LSCVRK89DYUA-ijvS5a_OQ-3IY07yORyLMPbdyz6285VYPviynfG-ScPxr8Kan_nJgS_ge7HX8zVs1vc85_hIoka3Yzt9nHcCbUZZe5Benl-e78Nb_p0Hy7cFqdbegT7wjqex-LYhPJ8HdoQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Ultrahigh-Sensitivity+Microwave+Sensor+for+Microfluidic+Complex+Permittivity+Measurement&rft.jtitle=IEEE+transactions+on+microwave+theory+and+techniques&rft.au=Ebrahimi%2C+Amir&rft.au=Scott%2C+James&rft.au=Ghorbani%2C+Kamran&rft.date=2019-10-01&rft.pub=IEEE&rft.issn=0018-9480&rft.volume=67&rft.issue=10&rft.spage=4269&rft.epage=4277&rft_id=info:doi/10.1109%2FTMTT.2019.2932737&rft.externalDocID=8809735
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9480&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9480&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9480&client=summon