Large-Scale Visual Language Model Boosted by Contrast Domain Adaptation for Intelligent Industrial Visual Monitoring - Wang, Huan; Li, Chenxi; Li, Yan-Fu (IEEE transactions on industrial informatics, 2024)
Keywords: Adaptation; Adaptation models; Decoding; Defect detection; Feature extraction; Image contrast; Image enhancement; industrial visual monitoring (IVM); large vision-language model (LVLM); Monitoring; Natural language processing; Natural languages; Semiconductor device modeling; semiconductor manufacturing; Tuning; Vision; Visualization