Curves-Based Similarity Method (CBSM) for Defect Depth Quantization

• Published in: IEEE transactions on instrumentation and measurement Vol. 72; p. 1
• Main Authors: Yang, Pengbin, Zhou, Xiuyun, He, Ruijie, Liu, Zhen
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.01.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Cooling rate; Defect Detection; Defects; Depth Quantification; Eddy currents; Feature extraction; Image segmentation; Image sequences; Inspection; Principal components analysis; Quantization (signal); Similarity; Surface impedance; Thermal imaging; Thermography

In the pulse eddy current thermal imaging experiments, the trends of temperature response curves of buried defects at different depths are same, but there are differences in cooling rates. The accuracy of depth quantification of buried defects can be improved by making full use of the rich informati...