Curves-Based Similarity Method (CBSM) for Defect Depth Quantization - Yang, Pengbin; Zhou, Xiuyun; He, Ruijie; Liu, Zhen (IEEE transactions on instrumentation and measurement, 2023)
Keywords: Algorithms; Cooling rate; Defect Detection; Defects; Depth Quantification; Eddy currents; Feature extraction; Image segmentation; Image sequences; Inspection; Principal components analysis; Quantization (signal); Similarity; Surface impedance; Thermal imaging; Thermography