APA (7th ed.) Citation

Yang, P., Zhou, X., He, R., & Liu, Z. (2023). Curves-Based Similarity Method (CBSM) for Defect Depth Quantization. IEEE transactions on instrumentation and measurement, 72, 1. https://doi.org/10.1109/TIM.2023.3323993

Chicago Style (17th ed.) Citation

Yang, Pengbin, Xiuyun Zhou, Ruijie He, and Zhen Liu. "Curves-Based Similarity Method (CBSM) for Defect Depth Quantization." IEEE Transactions on Instrumentation and Measurement 72 (2023): 1. https://doi.org/10.1109/TIM.2023.3323993.

MLA (9th ed.) Citation

Yang, Pengbin, et al. "Curves-Based Similarity Method (CBSM) for Defect Depth Quantization." IEEE Transactions on Instrumentation and Measurement, vol. 72, 2023, p. 1, https://doi.org/10.1109/TIM.2023.3323993.