A New Model of Outer Belt Electrons for Dielectric Internal Charging (MOBE-DIC)

The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to characterise the worst-case environment built on data from the Giove-A spacecraft. We use instrument data based on a novel technique of direct...

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Published inIEEE transactions on nuclear science Vol. 62; no. 6; pp. 2767 - 2775
Main Authors Hands, Alex, Ryden, Keith, Underwood, Craig, Rodgers, David, Evans, Hugh
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to characterise the worst-case environment built on data from the Giove-A spacecraft. We use instrument data based on a novel technique of direct charging current measurements, uncontaminated by protons and unaffected by dead-time, to create the model. The model provides integral or differential electron flux spectra with the following input parameters: percentile 90%, 99% or 100%; L-shell range 3-8; Magnetic Latitude ( B/B 0 ) range 1-100; Energy range 0.5-3 MeV. Comparisons with other models and independent data sets show that our "Model of Outer Belt Electrons for Dielectric Internal Charging" (MOBE-DIC) provides a sound worst-case specification for mission planners and design engineers. We find that, in medium Earth orbit particularly, MOBE-DIC indicates a harder electron spectrum than either AE9 or FLUMIC.
AbstractList The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to characterise the worst-case environment built on data from the Giove-A spacecraft. We use instrument data based on a novel technique of direct charging current measurements, uncontaminated by protons and unaffected by dead-time, to create the model. The model provides integral or differential electron flux spectra with the following input parameters: percentile 90%, 99% or 100%; L-shell range 3-8; Magnetic Latitude ([Formula Omitted]) range 1-100; Energy range 0.5-3 MeV. Comparisons with other models and independent data sets show that our "Model of Outer Belt Electrons for Dielectric Internal Charging" (MOBE-DIC) provides a sound worst-case specification for mission planners and design engineers. We find that, in medium Earth orbit particularly, MOBE-DIC indicates a harder electron spectrum than either AE9 or FLUMIC.
The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to characterise the worst-case environment built on data from the Giove-A spacecraft. We use instrument data based on a novel technique of direct charging current measurements, uncontaminated by protons and unaffected by dead-time, to create the model. The model provides integral or differential electron flux spectra with the following input parameters: percentile 90%, 99% or 100%; L-shell range 3-8; Magnetic Latitude ( B/B 0 ) range 1-100; Energy range 0.5-3 MeV. Comparisons with other models and independent data sets show that our "Model of Outer Belt Electrons for Dielectric Internal Charging" (MOBE-DIC) provides a sound worst-case specification for mission planners and design engineers. We find that, in medium Earth orbit particularly, MOBE-DIC indicates a harder electron spectrum than either AE9 or FLUMIC.
Author Hands, Alex
Evans, Hugh
Rodgers, David
Underwood, Craig
Ryden, Keith
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Cites_doi 10.1109/TPS.2008.2001945
10.1029/2000JA000234
10.1109/TPS.2015.2416436
10.1038/nature13956
10.2514/2.3575
10.1002/2014SW001143
10.1109/TNS.2013.2281937
10.2514/6.2010-1608
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References hands (ref6) 2007
ref14
taylor (ref7) 2013
ref20
vette (ref1) 1991
ref21
(ref13) 0
meredith (ref16) 0
rodgers (ref4) 2003
ref2
hands (ref10) 2015
rodriguez (ref12) 2014
ref8
johnston (ref19) 2014; 9085
ref9
ref3
ryden (ref11) 2001
lazaro (ref18) 2009
ref5
(ref22) 0
(ref17) 2011
rodriguez (ref15) 0
References_xml – ident: ref5
  doi: 10.1109/TPS.2008.2001945
– ident: ref21
  doi: 10.1029/2000JA000234
– ident: ref8
  doi: 10.1109/TPS.2015.2416436
– year: 2001
  ident: ref11
  article-title: Direct measurement of internal charging currents in geostationary transfer orbit
  publication-title: Proc 6th RADECS European Conf
  contributor:
    fullname: ryden
– ident: ref20
  doi: 10.1038/nature13956
– year: 2015
  ident: ref10
  publication-title: Exploitation of GIOVE in-Orbit Radiation Data for Environment Model and Effects Tools Update Task 3 Radiation Belt Model Validation
  contributor:
    fullname: hands
– year: 0
  ident: ref22
– year: 0
  ident: ref15
  contributor:
    fullname: rodriguez
– year: 2003
  ident: ref4
  article-title: The FLUMIC electron environment model
  publication-title: Proc Spacecraft Charging Technology Conf
  contributor:
    fullname: rodgers
– year: 1991
  ident: ref1
  publication-title: The AE-8 Trapped Electron Model Environment
  contributor:
    fullname: vette
– year: 2011
  ident: ref17
  article-title: Mitigating in-space charging effects - a guideline
  publication-title: NASA
– year: 0
  ident: ref13
– year: 2009
  ident: ref18
  publication-title: Energetic Electron Environment Models for MEO
  contributor:
    fullname: lazaro
– ident: ref3
  doi: 10.2514/2.3575
– year: 0
  ident: ref16
  contributor:
    fullname: meredith
– ident: ref14
  doi: 10.1002/2014SW001143
– ident: ref9
  doi: 10.1109/TNS.2013.2281937
– year: 2013
  ident: ref7
  publication-title: Exploitation of GIOVE in-orbit radiation data for environment model and effects tools update Task 1 electron calibration and data processing
  contributor:
    fullname: taylor
– year: 2007
  ident: ref6
  article-title: Modelling of SURF detector response in mixed electron/proton environments
  publication-title: Proc Ionising Radiation Detection and Data Exploitation Workshop
  contributor:
    fullname: hands
– volume: 9085
  year: 2014
  ident: ref19
  article-title: AE9/AP9/SPM: New models for radiation belt and space plasma specification
  publication-title: Proc SPIE
  contributor:
    fullname: johnston
– ident: ref2
  doi: 10.2514/6.2010-1608
– year: 2014
  ident: ref12
  article-title: GOES EPEAD science-quality electron fluxes algorithm theoretical basis document
  contributor:
    fullname: rodriguez
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Snippet The outer electron belt poses a significant radiation hazard to spacecraft due to internal charging and dose effects. We present a new user-friendly model to...
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StartPage 2767
SubjectTerms Data models
Dielectrics
Electrostatic discharges
Extraterrestrial measurements
Giove spacecraft
internal charging
Orbits
Space vehicles
trapped electron flux
Van Allen belts
Title A New Model of Outer Belt Electrons for Dielectric Internal Charging (MOBE-DIC)
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