Plasmons in Ballistic Nanostructures With Stubs: Transmission Line Approach

The plasma wave instabilities in ballistic field-effect transistors have a promise of developing sensitive terahertz detectors and efficient terahertz sources. One of the difficulties in achieving efficient resonant plasmonic detection and generation is assuring proper boundary conditions at the con...

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Published inIEEE transactions on electron devices Vol. 66; no. 1; pp. 126 - 131
Main Authors Aizin, Gregory R., Mikalopas, John, Shur, Michael S.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract The plasma wave instabilities in ballistic field-effect transistors have a promise of developing sensitive terahertz detectors and efficient terahertz sources. One of the difficulties in achieving efficient resonant plasmonic detection and generation is assuring proper boundary conditions at the contacts and at the heterointerfaces and tuning the plasma velocity. We propose using the tunable narrow channel regions of an increased width, which we call "stubs" for optimizing the boundary conditions and for controlling the plasma velocity. We developed a compact model for terahertz plasmonic devices using the transmission line (TL) analogy. The mathematics of the problem is similar to the mathematics of a TL with a stub. We applied this model to demonstrate that the stubs could effectively control the boundary conditions and/or the conditions at interfaces. We derived and solved the dispersion equation for the device with the stubs and showed that the periodic or aperiodic systems of stubs allow for slowing down the plasma waves in a controllable manner in a wide range.
AbstractList The plasma wave instabilities in ballistic field-effect transistors have a promise of developing sensitive terahertz detectors and efficient terahertz sources. One of the difficulties in achieving efficient resonant plasmonic detection and generation is assuring proper boundary conditions at the contacts and at the heterointerfaces and tuning the plasma velocity. We propose using the tunable narrow channel regions of an increased width, which we call "stubs" for optimizing the boundary conditions and for controlling the plasma velocity. We developed a compact model for terahertz plasmonic devices using the transmission line (TL) analogy. The mathematics of the problem is similar to the mathematics of a TL with a stub. We applied this model to demonstrate that the stubs could effectively control the boundary conditions and/or the conditions at interfaces. We derived and solved the dispersion equation for the device with the stubs and showed that the periodic or aperiodic systems of stubs allow for slowing down the plasma waves in a controllable manner in a wide range.
Author Mikalopas, John
Shur, Michael S.
Aizin, Gregory R.
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crossref_primary_10_1103_PhysRevApplied_17_054026
crossref_primary_10_3390_s21237907
crossref_primary_10_1103_PhysRevB_101_245404
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Cites_doi 10.1063/1.2794772
10.1109/TTHZ.2017.2710632
10.1049/ip-h-2.1992.0039
10.1109/JSSC.2013.2253403
10.1063/1.4726273
10.1063/1.2917246
10.1109/JSSC.2010.2051475
10.1103/PhysRevB.95.045405
10.1063/1.1468257
10.1063/1.5004132
10.1103/PhysRevB.93.195315
10.1088/0953-8984/20/38/384206
10.1103/PhysRevLett.71.2465
10.1109/TMTT.2010.2050103
10.1103/PhysRevB.51.14341
10.1007/0-387-37825-1
10.1103/PhysRevLett.109.126803
10.1063/1.125881
10.1021/nl300046g
10.1038/nphoton.2013.252
10.1049/el:19980706
10.1103/PhysRevB.86.235316
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References ref13
ref12
ref15
ref14
ref11
ref10
ref2
ref17
ref16
ref19
ref18
ref24
ref25
ref20
ref22
shur (ref1) 2015
ref8
pozar (ref23) 2012
ref7
ref9
ref4
ref3
ref6
fjeldly (ref21) 1998
ref5
References_xml – ident: ref15
  doi: 10.1063/1.2794772
– ident: ref5
  doi: 10.1109/TTHZ.2017.2710632
– ident: ref3
  doi: 10.1049/ip-h-2.1992.0039
– ident: ref6
  doi: 10.1109/JSSC.2013.2253403
– ident: ref9
  doi: 10.1063/1.4726273
– ident: ref2
  doi: 10.1063/1.2917246
– year: 1998
  ident: ref21
  publication-title: Introduction to Device Modeling and Circuit Simulation
  contributor:
    fullname: fjeldly
– year: 2012
  ident: ref23
  publication-title: Microwave Engineering
  contributor:
    fullname: pozar
– ident: ref7
  doi: 10.1109/JSSC.2010.2051475
– ident: ref11
  doi: 10.1103/PhysRevB.95.045405
– ident: ref22
  doi: 10.1063/1.1468257
– ident: ref24
  doi: 10.1063/1.5004132
– ident: ref10
  doi: 10.1103/PhysRevB.93.195315
– year: 2015
  ident: ref1
  publication-title: Fundamental & Applied Problems Of Terahertz Devices And Technologies Selected Papers From The Russia-japan-usa Symposium (Rjus Teratech-2014)
  contributor:
    fullname: shur
– ident: ref12
  doi: 10.1088/0953-8984/20/38/384206
– ident: ref8
  doi: 10.1103/PhysRevLett.71.2465
– ident: ref4
  doi: 10.1109/TMTT.2010.2050103
– ident: ref20
  doi: 10.1103/PhysRevB.51.14341
– ident: ref25
  doi: 10.1007/0-387-37825-1
– ident: ref16
  doi: 10.1103/PhysRevLett.109.126803
– ident: ref14
  doi: 10.1063/1.125881
– ident: ref13
  doi: 10.1021/nl300046g
– ident: ref18
  doi: 10.1038/nphoton.2013.252
– ident: ref19
  doi: 10.1049/el:19980706
– ident: ref17
  doi: 10.1103/PhysRevB.86.235316
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Snippet The plasma wave instabilities in ballistic field-effect transistors have a promise of developing sensitive terahertz detectors and efficient terahertz sources....
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StartPage 126
SubjectTerms Boundary conditions
Dyakonov–Shur (DS) instability
Field effect transistors
Logic gates
low-dimensional electron system
Mathematical analysis
Mathematical model
Mathematical models
Plasma waves
plasmonic boom
plasmonic crystals
plasmonic stub
Plasmons
Semiconductor devices
slow plasmons
Stability
terahertz
transmission line (TL)
Transmission lines
Title Plasmons in Ballistic Nanostructures With Stubs: Transmission Line Approach
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