Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure
In this paper, a novel uniform vertical inverter chains (UniVIC) single event multiple transient (SEMT) test structure is proposed for the first time. Charge sharing between standard inverters is measured for the first time experimentally. The heavy-ion experiment results in 65 nm bulk CMOS process...
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| Published in | IEEE transactions on nuclear science Vol. 62; no. 6; pp. 3330 - 3338 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
New York
IEEE
01.12.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects | |
| Online Access | Get full text |
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| Abstract | In this paper, a novel uniform vertical inverter chains (UniVIC) single event multiple transient (SEMT) test structure is proposed for the first time. Charge sharing between standard inverters is measured for the first time experimentally. The heavy-ion experiment results in 65 nm bulk CMOS process indicate that charge sharing can impact three transistors at most. At the same time, the occurring probability of charge sharing is attained for the first time experimentally. 3D TCAD simulations have also verified them. In total, the conclusions are helpful for researchers to have a direct knowledge of charge sharing in concrete circuits, and then to improve the precise of soft error evaluation. |
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| AbstractList | In this paper, a novel uniform vertical inverter chains (UniVIC) single event multiple transient (SEMT) test structure is proposed for the first time. Charge sharing between standard inverters is measured for the first time experimentally. The heavy-ion experiment results in 65 nm bulk CMOS process indicate that charge sharing can impact three transistors at most. At the same time, the occurring probability of charge sharing is attained for the first time experimentally. 3D TCAD simulations have also verified them. In total, the conclusions are helpful for researchers to have a direct knowledge of charge sharing in concrete circuits, and then to improve the precise of soft error evaluation. |
| Author | Pengcheng Huang Yaqing Chi Bin Liang Shuming Chen Jianjun Chen |
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| SubjectTerms | Charge measurement Charge sharing dual well (DW) heavy ion Inverters MOSFET single event multiple transient (SEMT) Transient analysis triple well (TW) |
| Title | Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure |
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