Monte Carlo Reliability Model for Single-Event Transient on Combinational Circuits - Liu, Baojun; Cai, Li (IEEE transactions on nuclear science, 2017)
Keywords: Circuit reliability; Circuits; Combinational circuits; Computer simulation; Integrated circuit modeling; Integrated circuit reliability; Masking; Masking effects; Monte carlo; Monte Carlo methods; Monte Carlo simulation; Reliability; Reliability analysis; Single event transients; single-event transient (SET); Transient analysis