APA (7th ed.) Citation

Liu, B., & Cai, L. (2017). Monte Carlo Reliability Model for Single-Event Transient on Combinational Circuits. IEEE transactions on nuclear science, 64(12), 2933-2937. https://doi.org/10.1109/TNS.2017.2772267

Chicago Style (17th ed.) Citation

Liu, Baojun, and Li Cai. "Monte Carlo Reliability Model for Single-Event Transient on Combinational Circuits." IEEE Transactions on Nuclear Science 64, no. 12 (2017): 2933-2937. https://doi.org/10.1109/TNS.2017.2772267.

MLA (9th ed.) Citation

Liu, Baojun, and Li Cai. "Monte Carlo Reliability Model for Single-Event Transient on Combinational Circuits." IEEE Transactions on Nuclear Science, vol. 64, no. 12, 2017, pp. 2933-2937, https://doi.org/10.1109/TNS.2017.2772267.