StructVIO: Visual-Inertial Odometry With Structural Regularity of Man-Made Environments

In this paper, we propose a novel visual-inertial odometry (VIO) approach that adopts structural regularity in man-made environments. Instead of using Manhattan world assumption, we use Atlanta world model to describe such regularity. An Atlanta world is a world that contains multiple local Manhatta...

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Published inIEEE transactions on robotics Vol. 35; no. 4; pp. 999 - 1013
Main Authors Zou, Danping, Wu, Yuanxin, Pei, Ling, Ling, Haibin, Yu, Wenxian
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract In this paper, we propose a novel visual-inertial odometry (VIO) approach that adopts structural regularity in man-made environments. Instead of using Manhattan world assumption, we use Atlanta world model to describe such regularity. An Atlanta world is a world that contains multiple local Manhattan worlds with different heading directions. Each local Manhattan world is detected on the fly, and their headings are gradually refined by the state estimator when new observations are received. With full exploration of structural lines that aligned with each local Manhattan worlds, our VIO method becomes more accurate and robust, as well as more flexible to different kinds of complex man-made environments. Through benchmark tests and real-world tests, the results show that the proposed approach outperforms existing visual-inertial systems in large-scale man-made environments.
AbstractList In this paper, we propose a novel visual-inertial odometry (VIO) approach that adopts structural regularity in man-made environments. Instead of using Manhattan world assumption, we use Atlanta world model to describe such regularity. An Atlanta world is a world that contains multiple local Manhattan worlds with different heading directions. Each local Manhattan world is detected on the fly, and their headings are gradually refined by the state estimator when new observations are received. With full exploration of structural lines that aligned with each local Manhattan worlds, our VIO method becomes more accurate and robust, as well as more flexible to different kinds of complex man-made environments. Through benchmark tests and real-world tests, the results show that the proposed approach outperforms existing visual-inertial systems in large-scale man-made environments.
Author Ling, Haibin
Zou, Danping
Pei, Ling
Wu, Yuanxin
Yu, Wenxian
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Cites_doi 10.1016/j.jvcir.2014.02.013
10.1109/ICRA.2015.7139926
10.15607/RSS.2012.VIII.031
10.1109/TPAMI.2007.1049
10.1109/CVPR.2004.1315033
10.1109/IROS.2009.5354508
10.1109/ICRA.2013.6631248
10.1109/TPAMI.2008.300
10.1109/ICCV.1999.790349
10.1109/TVT.2015.2388780
10.1109/CVPR.2009.5206867
10.1109/ICRA.2018.8462905
10.1177/0278364914554813
10.1177/0278364915620033
10.1109/IROS.2013.6696514
10.1109/ROBOT.2007.364024
10.3390/s18041159
10.1109/TRO.2015.2463671
10.1007/978-3-642-15561-1_35
10.1109/TRO.2008.2003276
10.1109/TPAMI.2017.2658577
10.1109/LRA.2017.2653359
10.1109/IROS.2012.6386223
10.1109/ICRA.2012.6224759
10.5244/C.20.3
10.15607/RSS.2013.IX.021
10.1109/IPIN.2012.6418915
10.1109/ISMAR.2007.4538852
10.1109/TRO.2016.2623335
10.1007/PL00013269
10.1007/s11263-011-0492-5
10.1109/ICRA.2016.7487406
10.1109/TRO.2018.2853729
10.1007/978-3-540-88682-2_41
10.1109/TPAMI.2012.104
10.1109/IROS.2009.5354754
10.1007/978-3-319-03413-3_49
10.1109/ICRA.2017.7989522
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References ref35
ref13
ref34
ref12
ref37
ref15
ref36
ref14
ref31
ref30
ref11
ref32
ref10
ref2
ref1
ref39
ref17
ref38
ref16
ref19
ref18
de la visión artificial (ref33) 2015
ref24
ref23
ref25
ref20
sola (ref26) 2017
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref3
ref6
ref5
ref40
References_xml – ident: ref18
  doi: 10.1016/j.jvcir.2014.02.013
– ident: ref23
  doi: 10.1109/ICRA.2015.7139926
– ident: ref28
  doi: 10.15607/RSS.2012.VIII.031
– ident: ref29
  doi: 10.1109/TPAMI.2007.1049
– ident: ref12
  doi: 10.1109/CVPR.2004.1315033
– ident: ref21
  doi: 10.1109/IROS.2009.5354508
– ident: ref40
  doi: 10.1109/ICRA.2013.6631248
– ident: ref27
  doi: 10.1109/TPAMI.2008.300
– ident: ref7
  doi: 10.1109/ICCV.1999.790349
– ident: ref11
  doi: 10.1109/TVT.2015.2388780
– ident: ref8
  doi: 10.1109/CVPR.2009.5206867
– ident: ref36
  doi: 10.1109/ICRA.2018.8462905
– ident: ref5
  doi: 10.1177/0278364914554813
– ident: ref31
  doi: 10.1177/0278364915620033
– ident: ref32
  doi: 10.1109/IROS.2013.6696514
– ident: ref4
  doi: 10.1109/ROBOT.2007.364024
– ident: ref17
  doi: 10.3390/s18041159
– ident: ref2
  doi: 10.1109/TRO.2015.2463671
– ident: ref9
  doi: 10.1007/978-3-642-15561-1_35
– ident: ref25
  doi: 10.1109/TRO.2008.2003276
– ident: ref38
  doi: 10.1109/TPAMI.2017.2658577
– ident: ref35
  doi: 10.1109/LRA.2017.2653359
– ident: ref39
  doi: 10.1109/IROS.2012.6386223
– ident: ref22
  doi: 10.1109/ICRA.2012.6224759
– ident: ref13
  doi: 10.5244/C.20.3
– ident: ref24
  doi: 10.15607/RSS.2013.IX.021
– ident: ref10
  doi: 10.1109/IPIN.2012.6418915
– ident: ref1
  doi: 10.1109/ISMAR.2007.4538852
– year: 2017
  ident: ref26
  article-title: Quaternion kinematics for the error-state Kalman filter
– ident: ref37
  doi: 10.1109/TRO.2016.2623335
– ident: ref34
  doi: 10.1007/PL00013269
– ident: ref19
  doi: 10.1007/s11263-011-0492-5
– ident: ref20
  doi: 10.1109/ICRA.2016.7487406
– ident: ref6
  doi: 10.1109/TRO.2018.2853729
– ident: ref30
  doi: 10.1007/978-3-540-88682-2_41
– ident: ref3
  doi: 10.1109/TPAMI.2012.104
– ident: ref14
  doi: 10.1109/IROS.2009.5354754
– ident: ref15
  doi: 10.1007/978-3-319-03413-3_49
– year: 2015
  ident: ref33
  article-title: ArUco: A minimal library for augmented reality applications based on OpenCV
– ident: ref16
  doi: 10.1109/ICRA.2017.7989522
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Snippet In this paper, we propose a novel visual-inertial odometry (VIO) approach that adopts structural regularity in man-made environments. Instead of using...
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SubjectTerms Atlanta world
Benchmark testing
Cameras
Feature extraction
inertial navigation
Odometers
Regularity
Simultaneous localization and mapping
structural lines
visual simultaneous localization and mapping (SLAM)
visual-inertial odometry (VIO)
Visualization
Title StructVIO: Visual-Inertial Odometry With Structural Regularity of Man-Made Environments
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