APA (7th ed.) Citation

Azamfar, M., Li, X., & Lee, J. (2020). Deep Learning-Based Domain Adaptation Method for Fault Diagnosis in Semiconductor Manufacturing. IEEE transactions on semiconductor manufacturing, 33(3), 445-453. https://doi.org/10.1109/TSM.2020.2995548

Chicago Style (17th ed.) Citation

Azamfar, Moslem, Xiang Li, and Jay Lee. "Deep Learning-Based Domain Adaptation Method for Fault Diagnosis in Semiconductor Manufacturing." IEEE Transactions on Semiconductor Manufacturing 33, no. 3 (2020): 445-453. https://doi.org/10.1109/TSM.2020.2995548.

MLA (9th ed.) Citation

Azamfar, Moslem, et al. "Deep Learning-Based Domain Adaptation Method for Fault Diagnosis in Semiconductor Manufacturing." IEEE Transactions on Semiconductor Manufacturing, vol. 33, no. 3, 2020, pp. 445-453, https://doi.org/10.1109/TSM.2020.2995548.