Time-Domain Characterization of Photonic Integrated Filters Subject to Fabrication Variations - Ye, Yinghao; Wang, Mi; Spina, Domenico; Bogaerts, Wim; Dhaene, Tom (Journal of lightwave technology, 2019)
Keywords: Baseband; Circuit design; Computational modeling; Computer simulation; Fabrication variations; Integrated circuit modeling; Integrated circuits; Modelling; Performance degradation; photonic integrated circuits; Photonics; polynomial Chaos; Polynomials; Random variables; Stochastic processes; Time domain analysis; time-domain variability analysis; Wave filters