Defects with deep levels in GaAs induced by plastic deformation and electron irradiation

Defects with deep electronic energy levels induced by plastic deformation at 450degC or electron irradiation at room temperature in boat-grown GaAs crystals are investigated by means of optical absorption. The optical absorption spectra associated with the induced defects are compared with that of g...

Full description

Saved in:
Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 27; no. 10; pp. 1929 - 1936
Main Authors HAGA, T, SUEZAWA, M, SUMINO, K
Format Journal Article
LanguageEnglish
Published Tokyo Japanese journal of applied physics 01.10.1988
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Defects with deep electronic energy levels induced by plastic deformation at 450degC or electron irradiation at room temperature in boat-grown GaAs crystals are investigated by means of optical absorption. The optical absorption spectra associated with the induced defects are compared with that of grown-in defects EL2. Thermal stabilities of the defects are studied by tracing the changes in the absorption spectra due to isochronal annealing of the specimens. The defects induced by the above two procedures are identified not to be EL2, even though some part of the defects gives rise to absorption similar to that caused by EL2 in the spectral shape. The absorptions in both the deformed and the irradiated samples are mostly photo-unquenchable. Deformation-induced defects responsible for this absorption are found to be As Ga antisite-related defects which are less thermally stable than EL2. Irradiation-induced defects giving rise to this kind of absorption are far more unstable in comparison with the deformation-induced defects, and are mostly eliminated by annealing at temperatures lower than 300degC.
AbstractList Defects with deep electronic energy levels induced by plastic deformation at 450degC or electron irradiation at room temperature in boat-grown GaAs crystals are investigated by means of optical absorption. The optical absorption spectra associated with the induced defects are compared with that of grown-in defects EL2. Thermal stabilities of the defects are studied by tracing the changes in the absorption spectra due to isochronal annealing of the specimens. The defects induced by the above two procedures are identified not to be EL2, even though some part of the defects gives rise to absorption similar to that caused by EL2 in the spectral shape. The absorptions in both the deformed and the irradiated samples are mostly photo-unquenchable. Deformation-induced defects responsible for this absorption are found to be As Ga antisite-related defects which are less thermally stable than EL2. Irradiation-induced defects giving rise to this kind of absorption are far more unstable in comparison with the deformation-induced defects, and are mostly eliminated by annealing at temperatures lower than 300degC.
Author SUEZAWA, M
SUMINO, K
HAGA, T
Author_xml – sequence: 1
  givenname: T
  surname: HAGA
  fullname: HAGA, T
  organization: Tohoku univ., inst. materials res., Sendai 980, Japan
– sequence: 2
  givenname: M
  surname: SUEZAWA
  fullname: SUEZAWA, M
  organization: Tohoku univ., inst. materials res., Sendai 980, Japan
– sequence: 3
  givenname: K
  surname: SUMINO
  fullname: SUMINO, K
  organization: Tohoku univ., inst. materials res., Sendai 980, Japan
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=6813805$$DView record in Pascal Francis
BookMark eNo9kEtLw0AUhQepYFrd-QNm4dLEeeW1DFWrpaALBXfhZuYOjqRJmIlK_72JFVeHw_3utzhLsuj6Dgm55CzhXMmb7bZ6TkSe8FKUJyTiUuWxYlm6IBFjgseqFOKMLEP4mGqWKh6Rt1u0qMdAv934Tg3iQFv8wjZQ19ENVHOaT42GNgc6tBBGpyfM9n4Po-s7Cp2h2E4KPxXnPRj3ezgnpxbagBd_uSKv93cv64d497R5XFe7WIuSj3HByoI1pUVpjBAMRG6YshwBUUuFzOSNVYrJxkBj0wJSywwASJZKy1XG5YpcH73a9yF4tPXg3R78oeasnlep51VqkdfzKhN-dcQHCBpa66HTLvz_ZAWXxeT-AWSJZM4
CODEN JJAPA5
CitedBy_id crossref_primary_10_1103_PhysRevB_45_8815
crossref_primary_10_1063_1_346168
crossref_primary_10_1063_1_346344
crossref_primary_10_1063_1_359749
crossref_primary_10_1063_1_349853
crossref_primary_10_1002_pssa_2211380235
crossref_primary_10_1063_1_348404
crossref_primary_10_1063_1_351741
crossref_primary_10_1002_pssb_2221950215
crossref_primary_10_1143_JJAP_30_1430
crossref_primary_10_1063_1_349693
crossref_primary_10_1080_10420158908213016
Cites_doi 10.1088/0022-3719/18/20/012
10.1007/BFb0108198
10.1063/1.94293
10.1063/1.331577
10.1143/JJAP.25.533
10.1088/0022-3719/19/20/010
10.1063/1.322978
10.1002/pssa.2210600250
10.1002/crat.19810160216
10.1063/1.92852
10.1016/0038-1098(81)90864-4
10.1007/BF00614772
10.1063/1.321564
10.1063/1.97527
10.1007/BF00886176
10.1103/PhysRevB.33.5880
ContentType Journal Article
Copyright 1990 INIST-CNRS
Copyright_xml – notice: 1990 INIST-CNRS
DBID IQODW
AAYXX
CITATION
DOI 10.1143/JJAP.27.1929
DatabaseName Pascal-Francis
CrossRef
DatabaseTitle CrossRef
DatabaseTitleList CrossRef
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1347-4065
EndPage 1936
ExternalDocumentID 10_1143_JJAP_27_1929
6813805
GroupedDBID 4.4
AALHV
ACGFS
ACNCT
AEFHF
AI.
ALMA_UNASSIGNED_HOLDINGS
ATQHT
CEBXE
F5P
IOP
IQODW
IZVLO
KOT
MC8
N5L
QTG
RNS
RW3
SJN
TKC
VH1
AAYXX
CITATION
ID FETCH-LOGICAL-c291t-80980b9fe3dd220a27d04f1eaeec34e0d7bf4403bdabf58a5f0daaa3053f14613
ISSN 0021-4922
IngestDate Fri Aug 23 01:52:21 EDT 2024
Fri Nov 25 01:10:54 EST 2022
IsPeerReviewed true
IsScholarly true
Issue 10
Keywords Complex defect
Temperature
Heat treatment
Semiconductor materials
Defect level
Infrared absorption
Plastic deformation
Experimental study
Inorganic compound
Gallium Arsenides
Radiation dose
Electronic structure
Irradiation
Electrons
Deep level
Language English
License CC BY 4.0
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c291t-80980b9fe3dd220a27d04f1eaeec34e0d7bf4403bdabf58a5f0daaa3053f14613
PageCount 8
ParticipantIDs crossref_primary_10_1143_JJAP_27_1929
pascalfrancis_primary_6813805
PublicationCentury 1900
PublicationDate 1988-10-01
PublicationDateYYYYMMDD 1988-10-01
PublicationDate_xml – month: 10
  year: 1988
  text: 1988-10-01
  day: 01
PublicationDecade 1980
PublicationPlace Tokyo
PublicationPlace_xml – name: Tokyo
PublicationTitle Japanese Journal of Applied Physics
PublicationYear 1988
Publisher Japanese journal of applied physics
Publisher_xml – name: Japanese journal of applied physics
References (crKey-10.1143/JJAP.27.1929-BIB11) 1979
(crKey-10.1143/JJAP.27.1929-BIB14) 1986; B33
(crKey-10.1143/JJAP.27.1929-BIB5) 1980; 60
(crKey-10.1143/JJAP.27.1929-BIB10) 1977
(crKey-10.1143/JJAP.27.1929-BIB19) 1983; 43
(crKey-10.1143/JJAP.27.1929-BIB2) 1976; 47
(crKey-10.1143/JJAP.27.1929-BIB6) 1980; 21
(crKey-10.1143/JJAP.27.1929-BIB24) 1981; 40
(crKey-10.1143/JJAP.27.1929-BIB23) 1986; 19
(crKey-10.1143/JJAP.27.1929-BIB3) 1977; 42
(crKey-10.1143/JJAP.27.1929-BIB17) 1986; 25
(crKey-10.1143/JJAP.27.1929-BIB18) 1988
(crKey-10.1143/JJAP.27.1929-BIB4) 1979; 40
(crKey-10.1143/JJAP.27.1929-BIB13) 1985; XXV
(crKey-10.1143/JJAP.27.1929-BIB9) 1986; A69
(crKey-10.1143/JJAP.27.1929-BIB8) 1983; 30
(crKey-10.1143/JJAP.27.1929-BIB1) 1975; 46
(crKey-10.1143/JJAP.27.1929-BIB16) 1986; 49
(crKey-10.1143/JJAP.27.1929-BIB15) 1981; 39
(crKey-10.1143/JJAP.27.1929-BIB21) 1983; 53
(crKey-10.1143/JJAP.27.1929-BIB7) 1981; 16
(crKey-10.1143/JJAP.27.1929-BIB12) 1985; 18
(crKey-10.1143/JJAP.27.1929-BIB22) 1984
(crKey-10.1143/JJAP.27.1929-BIB20) 1983; 116B
References_xml – volume: 18
  start-page: 3839
  year: 1985
  ident: crKey-10.1143/JJAP.27.1929-BIB12
  publication-title: J. Phys. C
  doi: 10.1088/0022-3719/18/20/012
– volume: XXV
  start-page: 623
  year: 1985
  ident: crKey-10.1143/JJAP.27.1929-BIB13
  publication-title: Festkörperprobleme
  doi: 10.1007/BFb0108198
– volume: 43
  start-page: 302
  year: 1983
  ident: crKey-10.1143/JJAP.27.1929-BIB19
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.94293
– volume: 53
  start-page: 6140
  year: 1983
  ident: crKey-10.1143/JJAP.27.1929-BIB21
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.331577
– volume: 42
  start-page: 522
  year: 1977
  ident: crKey-10.1143/JJAP.27.1929-BIB3
  publication-title: J. Phys. Soc. Jpn.
– volume: A69
  start-page: 423
  year: 1986
  ident: crKey-10.1143/JJAP.27.1929-BIB9
  publication-title: Acta Phys. Polonica
– volume: 25
  start-page: 533
  year: 1986
  ident: crKey-10.1143/JJAP.27.1929-BIB17
  publication-title: Jpn. J. Appl. Phys.
  doi: 10.1143/JJAP.25.533
– volume: 19
  start-page: 3745
  year: 1986
  ident: crKey-10.1143/JJAP.27.1929-BIB23
  publication-title: J. Phys. C
  doi: 10.1088/0022-3719/19/20/010
– volume: 40
  start-page: 75
  year: 1979
  ident: crKey-10.1143/JJAP.27.1929-BIB4
  publication-title: J. Phys.
– volume: 47
  start-page: 2588
  year: 1976
  ident: crKey-10.1143/JJAP.27.1929-BIB2
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.322978
– volume: 60
  start-page: K149
  year: 1980
  ident: crKey-10.1143/JJAP.27.1929-BIB5
  publication-title: Phys. Status Solidi A
  doi: 10.1002/pssa.2210600250
– volume: 16
  start-page: 217
  year: 1981
  ident: crKey-10.1143/JJAP.27.1929-BIB7
  publication-title: Cryst. Res. & Technol.
  doi: 10.1002/crat.19810160216
– year: 1988
  ident: crKey-10.1143/JJAP.27.1929-BIB18
– volume: 39
  start-page: 747
  year: 1981
  ident: crKey-10.1143/JJAP.27.1929-BIB15
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.92852
– volume: 40
  start-page: 473
  year: 1981
  ident: crKey-10.1143/JJAP.27.1929-BIB24
  publication-title: Solid State Commun.
  doi: 10.1016/0038-1098(81)90864-4
– volume: 30
  start-page: 233
  year: 1983
  ident: crKey-10.1143/JJAP.27.1929-BIB8
  publication-title: Appl. Phys. A
  doi: 10.1007/BF00614772
– volume: 46
  start-page: 5302
  year: 1975
  ident: crKey-10.1143/JJAP.27.1929-BIB1
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.321564
– year: 1984
  ident: crKey-10.1143/JJAP.27.1929-BIB22
– year: 1977
  ident: crKey-10.1143/JJAP.27.1929-BIB10
– year: 1979
  ident: crKey-10.1143/JJAP.27.1929-BIB11
– volume: 49
  start-page: 892
  year: 1986
  ident: crKey-10.1143/JJAP.27.1929-BIB16
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.97527
– volume: 21
  start-page: 257
  year: 1980
  ident: crKey-10.1143/JJAP.27.1929-BIB6
  publication-title: Appl. Phys.
  doi: 10.1007/BF00886176
– volume: B33
  start-page: 5880
  year: 1986
  ident: crKey-10.1143/JJAP.27.1929-BIB14
  publication-title: Phys. Rev.
  doi: 10.1103/PhysRevB.33.5880
– volume: 116B
  start-page: 398
  year: 1983
  ident: crKey-10.1143/JJAP.27.1929-BIB20
  publication-title: Physica
SSID ssj0026541
ssj0026590
ssj0026540
ssj0064762
Score 1.3648882
Snippet Defects with deep electronic energy levels induced by plastic deformation at 450degC or electron irradiation at room temperature in boat-grown GaAs crystals...
SourceID crossref
pascalfrancis
SourceType Aggregation Database
Index Database
StartPage 1929
SubjectTerms Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron states
Exact sciences and technology
Impurity and defect levels
Physics
Title Defects with deep levels in GaAs induced by plastic deformation and electron irradiation
Volume 27
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3fb9MwELaqISQQQjBAbDDkB3iaUpzYju3HCMa6SmyVWEXFS2THjjRpKlVpH8YfwN_NuU5cF01i8JI2SX-kvq93n5277xB62ziI46UtMwHBNmOamcwY6TIqLXhMpglv_IL-5_NyNGXjGZ8NBr-SrKX1ygybn7fWlfyPVeEY2NVXyf6DZeOHwgF4DvaFLVgYtney8UcXkjE2i6nWucXxtc8B2qS4nurKP9p1EzjmAmiyF2e1LtYrbm4c9H1wjq-WS69TEA3VM1aIpr5LZaoxoTvqGpZFIisfVafVTt71l-nJt-prtbPoCm787Pxiu8BqQwmelDF3rYsGd_zevloA5qgq1B4PXXCylAmYt4YeEb0XDgoBPdpI4lOBg6okPgPjLG_3_cxrUIzH1WRYiOH2XanE9h-hLyYkljKn0kvh3iuE4n4Sf3YxiRP3kntBnO1OnuyoeKZkouzE6cNP7ussGH2fXtUOA3q00D_gz9iGLioJtbl8gh53cxJcBYA9RQM330cPE6XKfXR_Eob8GZp1oMMedNiDDgfQ4as59qDDHeiwucEd6HACOgygwz3ocAK652j66eTywyjr2nNkTaHyFXAbJYlRraPWFgXRhbCEtbnTzjWUOWKFaRkj1FhtWi41b4nVWkOAoa3vJk9foL3597l7ibDOubCypEy2hDUs16TlVDeCKaoLytUBetcPWb0IKix1qKintR_auhC1H9oDdLQznvHFnX0P_3L-FXqwBfxrtLdart0RkM6VebNBxG8TsX8u
link.rule.ids 315,786,790,27957,27958
linkProvider IOP Publishing
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Defects+with+deep+levels+in+GaAs+induced+by+plastic+deformation+and+electron+irradiation&rft.jtitle=Japanese+journal+of+applied+physics&rft.au=HAGA%2C+T&rft.au=SUEZAWA%2C+M&rft.au=SUMINO%2C+K&rft.date=1988-10-01&rft.pub=Japanese+journal+of+applied+physics&rft.issn=0021-4922&rft.eissn=1347-4065&rft.volume=27&rft.issue=10&rft.spage=1929&rft.epage=1936&rft_id=info:doi/10.1143%2FJJAP.27.1929&rft.externalDBID=n%2Fa&rft.externalDocID=6813805
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0021-4922&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0021-4922&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0021-4922&client=summon