A Bidirectional Self-Rectifying Network With Bayesian Modeling for Vision-Based Crack Detection

• Published in: IEEE transactions on industrial informatics Vol. 19; no. 3; pp. 3017 - 3028
• Main Authors: Zhu, Qiuchen, Ha, Quang Phuc
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.03.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Bayes methods; Bayesian analysis; Bayesian inference; Coders; Convolution; crack detection; Deep learning; Feature extraction; hierarchical convolutional neural network; Informatics; Inspection; Machine learning; Machine vision; Modelling; Nonlinearity; Uncertainty

Robotic vision is increasingly applied for surface inspection of built infrastructure. For this, it is essential to develop robust algorithms for semantic segmentation. This article presents a deep learning approach using a bidirectional self-rectifying network with Bayesian modeling (BSNBM) for imp...