A Bidirectional Self-Rectifying Network With Bayesian Modeling for Vision-Based Crack Detection - Zhu, Qiuchen; Ha, Quang Phuc (IEEE transactions on industrial informatics, 2023)
Keywords: Algorithms; Bayes methods; Bayesian analysis; Bayesian inference; Coders; Convolution; crack detection; Deep learning; Feature extraction; hierarchical convolutional neural network; Informatics; Inspection; Machine learning; Machine vision; Modelling; Nonlinearity; Uncertainty