APA (7th ed.) Citation

Yeap, Y. M., Geddada, N., Satpathi, K., & Ukil, A. (2018). Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System. IEEE transactions on industrial informatics, 14(10), 4353-4364. https://doi.org/10.1109/TII.2018.2796068

Chicago Style (17th ed.) Citation

Yeap, Yew Ming, Nagesh Geddada, Kuntal Satpathi, and Abhisek Ukil. "Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System." IEEE Transactions on Industrial Informatics 14, no. 10 (2018): 4353-4364. https://doi.org/10.1109/TII.2018.2796068.

MLA (9th ed.) Citation

Yeap, Yew Ming, et al. "Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System." IEEE Transactions on Industrial Informatics, vol. 14, no. 10, 2018, pp. 4353-4364, https://doi.org/10.1109/TII.2018.2796068.