Analysis and Diagnosis of Shielded Cable Faults Based on Finite-Element Method and Time-Reversal Time-Frequency Domain Reflectometry

Due to the electrical, thermal, and mechanical stress, the insulating materials of cable undergo a slow aging process in service, which leads to the decline of insulation performance. Besides, friction frequently occurs when the cable is moving or vibrating, which will easily cause mechanical damage...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on industrial electronics (1982) Vol. 69; no. 4; pp. 4205 - 4214
Main Authors Hua, Xu, Wang, Li, Zhang, Yaojia
Format Journal Article
LanguageEnglish
Published New York IEEE 01.04.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Aging
Cable shielding
Characteristic impedance
Damage
Fault diagnosis
Finite element analysis
Finite element method
finite-element method (FEM)
Frequency domain analysis
Impedance
Insulation
Mathematical models
Power cable insulation
Power cables
Reflectometry
time-frequency domain reflectometry (TFDR)
time-reversal
Two dimensional models
Online AccessGet full text
ISSN0278-0046
1557-9948
DOI10.1109/TIE.2021.3071685

Cover

Abstract Due to the electrical, thermal, and mechanical stress, the insulating materials of cable undergo a slow aging process in service, which leads to the decline of insulation performance. Besides, friction frequently occurs when the cable is moving or vibrating, which will easily cause mechanical damage including frays and chafes. Both aging and damage will cause the characteristic impedance to change. Therefore, it is of great significance for the safe operation of the cable to analyze the variations of characteristic impedance and to make an effective diagnosis. In this article, a two-dimensional model of the cable containing defects is first built, and the characteristic impedance of the model is calculated by the finite-element method (FEM). Meanwhile, a quantitative analysis of the characteristic impedance under two defect types is carried out. Second, combining the space-time focusing of time-reversal and the time-frequency characteristics of reflectometry, the time-reversal time-frequency domain reflectometry (TRTFDR) is proposed to diagnose the cable faults. Based on the distributed parameters calculated by the FEM, the TRTFDR simulation model is established to study the judgment of different faults. Finally, the validity of this method is verified by experiments.
AbstractList Due to the electrical, thermal, and mechanical stress, the insulating materials of cable undergo a slow aging process in service, which leads to the decline of insulation performance. Besides, friction frequently occurs when the cable is moving or vibrating, which will easily cause mechanical damage including frays and chafes. Both aging and damage will cause the characteristic impedance to change. Therefore, it is of great significance for the safe operation of the cable to analyze the variations of characteristic impedance and to make an effective diagnosis. In this article, a two-dimensional model of the cable containing defects is first built, and the characteristic impedance of the model is calculated by the finite-element method (FEM). Meanwhile, a quantitative analysis of the characteristic impedance under two defect types is carried out. Second, combining the space-time focusing of time-reversal and the time-frequency characteristics of reflectometry, the time-reversal time-frequency domain reflectometry (TRTFDR) is proposed to diagnose the cable faults. Based on the distributed parameters calculated by the FEM, the TRTFDR simulation model is established to study the judgment of different faults. Finally, the validity of this method is verified by experiments.
Author Zhang, Yaojia
Hua, Xu
Wang, Li
Author_xml – sequence: 1
  givenname: Xu
  orcidid: 0000-0002-5803-4276
  surname: Hua
  fullname: Hua, Xu
  email: huaxu@nuaa.edu.cn
  organization: Department of Electrical Engineering, College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China
– sequence: 2
  givenname: Li
  orcidid: 0000-0002-7539-3932
  surname: Wang
  fullname: Wang, Li
  email: liwang@nuaa.edu.cn
  organization: Department of Electrical Engineering, College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China
– sequence: 3
  givenname: Yaojia
  orcidid: 0000-0002-0720-8766
  surname: Zhang
  fullname: Zhang, Yaojia
  email: zhangyaojia@nuaa.edu.cn
  organization: Department of Electrical Engineering, College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China
BookMark eNp9kEtLAzEUhYNUsD72gpuA66lJJsnMLGsfWlAEreshndzRSCapSSp07w93asWFC1eXcznnPr5jNHDeAULnlIwoJdXVcjEbMcLoKCcFlaU4QEMqRJFVFS8HaEhYUWaEcHmEjmN8I4RyQcUQfY6dsttoIlZO46lRL87vlG_x06sBq0HjiVpZwHO1sSniaxX7lnd4bpxJkM0sdOASvof06vX3lKXpIHuEDwhR2b2aB3jfgGu2eOo7ZRx-hNZCk3wHKWxP0WGrbISzn3qCnuez5eQ2u3u4WUzGd1nDKpoyIVnDW6q0bgXhrH9bVwXXq5ILpmleiLxQKleUtKySui2kEHxVlVqWpdC5ZvkJutzPXQffnxNT_eY3oQcQayYp41KKkvQusnc1wccYoK3XwXQqbGtK6h3rumdd71jXP6z7iPwTaUxSyXiXgjL2v-DFPmgA4HdPxYnMpcy_ALHJjZA
CODEN ITIED6
CitedBy_id crossref_primary_10_1109_TIM_2022_3169548
crossref_primary_10_1166_jno_2022_3231
crossref_primary_10_1166_jno_2022_3342
crossref_primary_10_1109_TTE_2024_3418382
crossref_primary_10_3389_fphy_2024_1432527
crossref_primary_10_1007_s12206_022_1208_1
crossref_primary_10_1016_j_measurement_2024_114178
crossref_primary_10_1088_1361_6501_ad0069
crossref_primary_10_1088_1361_6501_ad8f4d
crossref_primary_10_1109_TIE_2024_3374401
crossref_primary_10_12688_digitaltwin_17718_2
crossref_primary_10_1109_TIM_2023_3246483
crossref_primary_10_1109_TTE_2024_3441690
crossref_primary_10_12688_digitaltwin_17718_1
crossref_primary_10_1038_s41598_024_55736_9
crossref_primary_10_1109_TPWRD_2024_3516122
crossref_primary_10_1109_TDEI_2022_3217425
crossref_primary_10_1155_2022_7456622
crossref_primary_10_1016_j_epsr_2024_111181
crossref_primary_10_1109_TIE_2024_3363743
crossref_primary_10_1007_s00202_024_02877_9
Cites_doi 10.1109/JSEN.2005.858964
10.1049/iet-spr.2009.0137
10.1109/TIM.2014.2304353
10.1109/TEMC.2018.2814629
10.1109/TMAG.2007.892426
10.1109/LGRS.2016.2630734
10.1109/61.311145
10.1109/TDEI.2009.5211873
10.1109/TDEI.2008.4543118
10.1109/ACCESS.2018.2890157
10.1109/IEEESTD.2012.6213052
10.1049/hve.2016.0012
10.1109/TAP.2010.2090462
10.1109/TDEI.2014.004557
10.1002/9781118936160.ch4
10.1109/LPT.2014.2358262
10.1109/HOLM.2012.6336569
10.1109/TIM.2005.858115
10.1109/TDEI.2019.008189
10.1109/TIE.2019.2917417
10.1109/TIM.2016.2578578
10.1109/TDEI.2013.6518962
10.1109/TIE.2018.2842737
10.1109/TDEI.2018.006856
10.1109/29.103085
10.1109/TIE.2018.2881935
10.1109/TEMC.2003.811305
10.1109/TIE.2018.2840529
10.1016/j.epsr.2017.12.027
10.1109/TDEI.2002.1007694
10.1109/JSEN.2013.2294193
10.1109/TIM.2012.2187246
10.1109/MEMC.2013.6512221
10.1109/JSEN.2006.874017
10.1109/IEEESTD.2007.305045
10.3390/polym11060971
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TIE.2021.3071685
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1557-9948
EndPage 4214
ExternalDocumentID 10_1109_TIE_2021_3071685
9406366
Genre orig-research
GrantInformation_xml – fundername: National Natural Science Foundation of China
  grantid: 51877102
  funderid: 10.13039/501100001809
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
97E
9M8
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACKIV
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RNS
TAE
TN5
TWZ
VH1
VJK
AAYXX
CITATION
RIG
7SP
8FD
L7M
ID FETCH-LOGICAL-c291t-562c4f1addf5042110d974db8452d137537aa3a10f296df76554b98d6885d3d23
IEDL.DBID RIE
ISSN 0278-0046
IngestDate Mon Jun 30 10:18:53 EDT 2025
Tue Jul 01 00:16:41 EDT 2025
Thu Apr 24 22:56:25 EDT 2025
Wed Aug 27 05:07:52 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 4
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c291t-562c4f1addf5042110d974db8452d137537aa3a10f296df76554b98d6885d3d23
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0002-5803-4276
0000-0002-0720-8766
0000-0002-7539-3932
PQID 2612466580
PQPubID 85464
PageCount 10
ParticipantIDs ieee_primary_9406366
proquest_journals_2612466580
crossref_primary_10_1109_TIE_2021_3071685
crossref_citationtrail_10_1109_TIE_2021_3071685
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2022-04-01
PublicationDateYYYYMMDD 2022-04-01
PublicationDate_xml – month: 04
  year: 2022
  text: 2022-04-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on industrial electronics (1982)
PublicationTitleAbbrev TIE
PublicationYear 2022
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref35
ref12
ref34
ref15
ref14
ref36
ref31
ref30
ref11
ref33
ref10
ref32
ref2
ref1
ref17
ref16
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref17
  doi: 10.1109/JSEN.2005.858964
– ident: ref32
  doi: 10.1049/iet-spr.2009.0137
– ident: ref14
  doi: 10.1109/TIM.2014.2304353
– ident: ref28
  doi: 10.1109/TEMC.2018.2814629
– ident: ref30
  doi: 10.1109/TMAG.2007.892426
– ident: ref34
  doi: 10.1109/LGRS.2016.2630734
– ident: ref11
  doi: 10.1109/61.311145
– ident: ref4
  doi: 10.1109/TDEI.2009.5211873
– ident: ref5
  doi: 10.1109/TDEI.2008.4543118
– ident: ref9
  doi: 10.1109/ACCESS.2018.2890157
– ident: ref1
  doi: 10.1109/IEEESTD.2012.6213052
– ident: ref7
  doi: 10.1049/hve.2016.0012
– ident: ref22
  doi: 10.1109/TAP.2010.2090462
– ident: ref3
  doi: 10.1109/TDEI.2014.004557
– ident: ref27
  doi: 10.1002/9781118936160.ch4
– ident: ref35
  doi: 10.1109/LPT.2014.2358262
– ident: ref33
  doi: 10.1109/HOLM.2012.6336569
– ident: ref16
  doi: 10.1109/TIM.2005.858115
– ident: ref31
  doi: 10.1109/TDEI.2019.008189
– ident: ref29
  doi: 10.1109/TIE.2019.2917417
– ident: ref24
  doi: 10.1109/TIM.2016.2578578
– ident: ref26
  doi: 10.1109/TDEI.2013.6518962
– ident: ref23
  doi: 10.1109/TIE.2018.2842737
– ident: ref10
  doi: 10.1109/TDEI.2018.006856
– ident: ref36
  doi: 10.1109/29.103085
– ident: ref13
  doi: 10.1109/TIE.2018.2881935
– ident: ref15
  doi: 10.1109/TEMC.2003.811305
– ident: ref25
  doi: 10.1109/TIE.2018.2840529
– ident: ref6
  doi: 10.1016/j.epsr.2017.12.027
– ident: ref8
  doi: 10.1109/TDEI.2002.1007694
– ident: ref19
  doi: 10.1109/JSEN.2013.2294193
– ident: ref21
  doi: 10.1109/TIM.2012.2187246
– ident: ref20
  doi: 10.1109/MEMC.2013.6512221
– ident: ref18
  doi: 10.1109/JSEN.2006.874017
– ident: ref2
  doi: 10.1109/IEEESTD.2007.305045
– ident: ref12
  doi: 10.3390/polym11060971
SSID ssj0014515
Score 2.5201614
Snippet Due to the electrical, thermal, and mechanical stress, the insulating materials of cable undergo a slow aging process in service, which leads to the decline of...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 4205
SubjectTerms Aging
Cable shielding
Characteristic impedance
Damage
Fault diagnosis
Finite element analysis
Finite element method
finite-element method (FEM)
Frequency domain analysis
Impedance
Insulation
Mathematical models
Power cable insulation
Power cables
Reflectometry
time-frequency domain reflectometry (TFDR)
time-reversal
Two dimensional models
Title Analysis and Diagnosis of Shielded Cable Faults Based on Finite-Element Method and Time-Reversal Time-Frequency Domain Reflectometry
URI https://ieeexplore.ieee.org/document/9406366
https://www.proquest.com/docview/2612466580
Volume 69
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BTtwwEB0BJ3poSynqthT50EulZjdxHCc5trARrbQcEEjcIttjS4glqZbsgZ75cMZOskJthbjZkp1YmbE9k3kzD-ALGsSCax1JbWQkLLVUnqfkqsRO6twZHpLEFmfy9FL8usqutuDbJhfGWhvAZ3bqmyGWj61Z-19ls5Jun1TKbdgmNetztTYRA5H1bAXcV4wlp28MScbl7OLnnBxBnkxJnxPpWZOfXEGBU-WfgzjcLtUbWIzr6kElN9N1p6fmz18lG1-68LfwejAz2fdeL_Zgyzbv4NWT4oP78DDWI2GqQXbSQ-6o1zrmCbKXaJEd-8QqVqn1srtjP-jCQ9Y2rLr2hmo075HnbBFIqMNTfEJJdG491IPeHnrVqgdr37OT9lZdN-zcuhAquLXd6v49XFbzi-PTaOBkiAwvky4ic8kIl9Cp6DLa7_R9kTwS1IXIOCYpOT-5UqlKYsdLiS6XZK7oskBZFBmmyNMD2Gnaxn4AJpBnxuUpFhkXuVaFMGRbKqOM1CpP-ARmo5hqMxQs97wZyzo4LnFZk2BrL9h6EOwEvm5m_O6LdTwzdt_LaTNuENEEDkdNqIfdfFf7MmtCkq0Wf_z_rE-wy31aRED0HMJOt1rbz2SsdPooaOkjsAbmNw
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT9wwEB1ROLQcKC1FLKXgQy-Vmt3EcZzk2MJGS8tyQIvELfKnhFgStGQPcOaHd-wkK9RWiJst2YmVsT1vMjNvAL5qpXVGpQy4VDxgBlsiTWM0VULLZWoV9Uli03M-uWS_rpKrNfi-yoUxxvjgMzN0Te_L17Vaul9loxy1T8z5G9hAvc-SNltr5TNgSVuvgDrOWDT7eqdkmI9mp2M0BWk0xB0dcVc3-ZkS8lVV_rmKvX4p3sO0X1kbVnIzXDZyqB7_Im187dK3YasDmuRHuzM-wJqpPsLmM_rBHXjqGUmIqDQ5aYPusFdb4kpkz7XR5NilVpFCLOfNPfmJKk-TuiLFtYOqwbiNPSdTX4baP8WllAQXxgV74Nt9r1i04doP5KS-FdcVuTDWOwtuTbN4-ASXxXh2PAm6qgyBonnUBAiYFLMR3os2wROP31ejTaJlxhKqoxjNn1SIWEShpTnXNuUIWGSeaZ5liY41jXdhvaorsweEaZoom8Y6SyhLpciYQnQplFBcijSiAxj1YipVR1nuKmfMS2-6hHmJgi2dYMtOsAP4tppx19J1vDB2x8lpNa4T0QAO-p1Qduf5vnREa4wjWgv3_z_rCN5OZtOz8uz0_PdneEddkoSP7zmA9WaxNF8QujTy0O_YP-S_6YQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Analysis+and+Diagnosis+of+Shielded+Cable+Faults+Based+on+Finite-Element+Method+and+Time-Reversal+Time-Frequency+Domain+Reflectometry&rft.jtitle=IEEE+transactions+on+industrial+electronics+%281982%29&rft.au=Hua%2C+Xu&rft.au=Wang%2C+Li&rft.au=Zhang%2C+Yaojia&rft.date=2022-04-01&rft.issn=0278-0046&rft.eissn=1557-9948&rft.volume=69&rft.issue=4&rft.spage=4205&rft.epage=4214&rft_id=info:doi/10.1109%2FTIE.2021.3071685&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TIE_2021_3071685
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0046&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0046&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0046&client=summon