Health State Estimation and Remaining Useful Life Prediction of Power Devices Subject to Noisy and Aperiodic Condition Monitoring - Zhao, Shuai; Peng, Yingzhou; Yang, Fei; Ugur, Enes; Akin, Bilal; Wang, Huai (IEEE transactions on instrumentation and measurement, 2021)
Keywords: Accelerated aging tests; Aging (metallurgy); Algorithms; Condition monitoring; Degradation; Degradation modeling; Diagnostic systems; Electronic devices; Field effect transistors; gamma process; Heterogeneity; Life prediction; Measurement uncertainty; Model accuracy; MOSFETs; Noise levels; Noise measurement; noisy and aperiodic measurements; Numerical analysis; Parameter estimation; particle filter (PF); Pollution measurement; Predictive models; remaining useful life (RUL) prediction; Robustness (mathematics); Semiconductor devices; SiC metal–oxide-semiconductor field-effect transistors (MOSFETs); State estimation; State space models; Uncertainty; Useful life