Nanoporosity effect in optical loss of single-mode polymer waveguides
We fabricate single-mode polymer waveguide structures exhibiting polarization-independent ultra-low loss of 0.04 and 0.05 dB/cm at the 1310 and 1550 nm bands, respectively, with a Deltan of 1.6%. A porous structure that arises during the fabrication process is studied by considering its implications...
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Published in | Applied optics. Optical technology and biomedical optics Vol. 49; no. 19; p. 3684 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
01.07.2010
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Abstract | We fabricate single-mode polymer waveguide structures exhibiting polarization-independent ultra-low loss of 0.04 and 0.05 dB/cm at the 1310 and 1550 nm bands, respectively, with a Deltan of 1.6%. A porous structure that arises during the fabrication process is studied by considering its implications in the propagation loss based on the Rayleigh-Mie scattering loss mechanism. We demonstrate that the porous structure is to be reduced to the nanoscale (i.e., <10 nm) to realize waveguide structures with ultra-low propagation losses based on fabrications and measurements of morphologies with various degrees of porosity. Further, the bending loss and its respective polarization-dependent propagation loss behavior are analyzed to realize compact devices with ultra-low-loss and polarization-independent features, where a 4 mm bending radius is found to be adequate for such a performance over the 1550 nm band. |
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AbstractList | We fabricate single-mode polymer waveguide structures exhibiting polarization-independent ultra-low loss of 0.04 and 0.05 dB/cm at the 1310 and 1550 nm bands, respectively, with a Deltan of 1.6%. A porous structure that arises during the fabrication process is studied by considering its implications in the propagation loss based on the Rayleigh-Mie scattering loss mechanism. We demonstrate that the porous structure is to be reduced to the nanoscale (i.e., <10 nm) to realize waveguide structures with ultra-low propagation losses based on fabrications and measurements of morphologies with various degrees of porosity. Further, the bending loss and its respective polarization-dependent propagation loss behavior are analyzed to realize compact devices with ultra-low-loss and polarization-independent features, where a 4 mm bending radius is found to be adequate for such a performance over the 1550 nm band. |
Author | Gao, Renfeng Yeniay, Aydin |
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