Optimal Inspection and Replacement Policies for Multi-Unit Systems Subject to Degradation - Sun, Qiuzhuang; Ye, Zhi-Sheng; Chen, Nan (IEEE transactions on reliability, 2018)
Keywords: Black boxes; Condition monitoring; Condition-based maintenance (CBM); control limit policy; Control limits; Degradation; Inspection; Iterative algorithms; Iterative methods; K-out-of-N: G systems; Maintenance costs; Maintenance engineering; Maintenance management; Markov decision process; Markov processes; Optimal control; Process control; Sensitivity analysis; Strategy; System effectiveness; Wiener process