Accelerated Degradation Tests Planning With Competing Failure Modes - Zhao, Xiujie; Xu, Jianyu; Liu, Bin (IEEE transactions on reliability, 2018)
Keywords: Accelerated degradation tests (ADT); Accelerated tests; competing failure modes; Degradation; degradation modeling; Economic models; Electric shock; Failure modes; Fisher information; Life estimation; Numerical methods; optimal design; Optimality criteria; Optimization; Planning; Poisson density functions; Process parameters; Reliability analysis; reliability assessment; Reliability engineering; Robustness (mathematics); Sensitivity analysis; Statistical analysis; Stress