Wang, J., Li, T., Shi, Y., Lian, S., & Ye, J. (2017). Forensics feature analysis in quaternion wavelet domain for distinguishing photographic images and computer graphics. Multimedia tools and applications, 76(22), 23721-23737. https://doi.org/10.1007/s11042-016-4153-0
Chicago Style (17th ed.) CitationWang, Jinwei, Ting Li, Yun-Qing Shi, Shiguo Lian, and Jingyu Ye. "Forensics Feature Analysis in Quaternion Wavelet Domain for Distinguishing Photographic Images and Computer Graphics." Multimedia Tools and Applications 76, no. 22 (2017): 23721-23737. https://doi.org/10.1007/s11042-016-4153-0.
MLA (9th ed.) CitationWang, Jinwei, et al. "Forensics Feature Analysis in Quaternion Wavelet Domain for Distinguishing Photographic Images and Computer Graphics." Multimedia Tools and Applications, vol. 76, no. 22, 2017, pp. 23721-23737, https://doi.org/10.1007/s11042-016-4153-0.