Test Input Prioritization for Graph Neural Networks - Li, Yinghua; Dang, Xueqi; Pian, Weiguo; Habib, Andrew; Klein, Jacques; Bissyande, Tegawende F. (IEEE transactions on software engineering, 2024)
Keywords: Artificial neural networks; Context modeling; Datasets; Ensemble learning; Fault detection; Graph neural networks; Labeling; labelling; learning to rank; Machine learning; Mutation; mutation analysis; Neural networks; Operators; Predictive models; Ranking; Structured data; Test input prioritization; Testing