A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes

In this paper, a scanning thermal microscopy (SThM) module with a modified Wheatstone bridge is presented. It is intended to be used with a novel four-terminal thermoresistive nanoprobe, which was designed for performing thermal measurements in standard static-mode atomic force microscopes. The modi...

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Bibliographic Details
Published inMeasurement science & technology Vol. 22; no. 9; pp. 94023 - 1-6
Main Authors Wielgoszewski, Grzegorz, Sulecki, Przemysław, Janus, Paweł, Grabiec, Piotr, Zschech, Ehrenfried, Gotszalk, Teodor
Format Journal Article
LanguageEnglish
Published 01.09.2011
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