A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes
In this paper, a scanning thermal microscopy (SThM) module with a modified Wheatstone bridge is presented. It is intended to be used with a novel four-terminal thermoresistive nanoprobe, which was designed for performing thermal measurements in standard static-mode atomic force microscopes. The modi...
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Published in | Measurement science & technology Vol. 22; no. 9; pp. 94023 - 1-6 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
01.09.2011
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Subjects | |
Online Access | Get full text |
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