Structural, morphological, and optical bandgap properties of ZnS thin films: a case study on thickness dependence

• Published in: Optical and quantum electronics Vol. 56; no. 7
• Main Authors: Grayeli, Alireza, Sadeghi, Mohammad, Shakoury, Reza, Matos, Robert Saraiva, da Fonseca Filho, Henrique Duarte, Arman, Ali
• Format: Journal Article
• Language: English
• Published: New York Springer US 02.06.2024; Springer Nature B.V
• Subjects: Absorption spectroscopy; AFM; Bandgap properties; Blue shift; Case-studies; Characterization and Evaluation of Materials; Computer Communication Networks; Crystallite size; Crystallites; Electrical Engineering; Electron diffraction; Elongated structure; Energy gap; Film thickness; Fractals; Glass substrates; II-VI semiconductors; Infrared devices; Infrared spectra; Lasers; Magnetic properties; Magnetron sputtering; Morphology; Multi fractals; Multifractal; Nanocrystals; Near infrared radiation; Optical Devices; Optical properties; Optical-bandgap; Optics; Percolation; Photonics; Physics; Physics and Astronomy; Solvents; Sputtering; Structural analysis; Temperature dependence; Thin films; Topography; X ray diffraction; X- ray diffractions; XRD; Zinc sulfide; Zinc sulfide thin films; Zinc sulfide; AFM; XRD; Optical properties; Sputtering; Multifractal

Thin films of zinc sulfide (ZnS) with varying thicknesses have been successfully fabricated using radio frequency magnetron sputtering on glass substrates at a temperature of 300 K. Structural analysis via X-ray diffraction and selected area electron diffraction confirmed the presence of nanocrystal...