Spotting Culprits in Epidemics: How Many and Which Ones?

• Published in: 2012 IEEE 12th International Conference on Data Mining pp. 11 - 20
• Main Authors: Prakash, B. A., Vreeken, J., Faloutsos, C.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.12.2012
• Subjects: culprits; Data models; diffusion; Encoding; epidemics; Equations; Integrated circuit modeling; Nickel; Reliability; seeds; Silicon

Given a snapshot of a large graph, in which an infection has been spreading for some time, can we identify those nodes from which the infection started to spread? In other words, can we reliably tell who the culprits are? In this paper we answer this question affirmatively, and give an efficient met...