Revealing DRAM Operating GuardBands Through Workload-Aware Error Predictive Modeling
Improving the energy efficiency of DRAMs becomes very challenging due to the growing demand for storage capacity and failures induced by the manufacturing process. To protect against failures, vendors adopt conservative margins in the refresh period and supply voltage. Previously, it was shown that...
Saved in:
Published in | IEEE transactions on computers Vol. 70; no. 11; pp. 1976 - 1987 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.11.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!