Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates
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Published in | Journal of alloys and compounds Vol. 509; no. 5; pp. 2176 - 2179 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
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Kidlington
Elsevier
03.02.2011
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Author | OH, Dohyun YOUNG SOO NO KAE DAL KWACK WOON JO CHO TAE WHAN KIM SU YOUN KIM |
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Cites_doi | 10.1002/adma.200305041 10.1016/S0040-6090(99)00211-4 10.1016/S0040-6090(03)00243-8 10.1016/j.tsf.2007.06.028 10.1016/S0169-4332(02)00611-6 10.1016/j.solmat.2009.02.023 10.1016/j.tsf.2007.04.027 10.1016/j.tsf.2004.08.032 10.1016/j.tsf.2007.10.032 10.1016/j.cap.2009.07.002 10.1038/40087 10.1016/j.solener.2004.03.015 10.1016/j.tsf.2007.05.051 10.1016/j.apsusc.2007.07.080 10.1016/j.tsf.2007.08.089 10.1063/1.1598624 10.1063/1.1644318 10.1002/adma.200306015 10.1016/j.apsusc.2006.03.032 10.1016/j.tsf.2007.02.087 |
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Keywords | Solar cells Atomic force microscopy Electronic properties Electrical conductivity Electrical properties 68.65.Ac AFM X-ray diffraction XRD 73.21.Ac Absorption coefficients Layer thickness Transmittance Thin films Multilayers Electronic structure Optical properties 72.15.Eb 78.66.Bz Island structure Oxide materials |
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SubjectTerms | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics Structure and morphology; thickness Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
Title | Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates |
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