Optical-Electrical Characteristics and Carrier Dynamics of Semi-Insulation GaAs by Terahertz Spectroscopic Technique

OaAs has been widely used to fabricate a variety of optoelectronic devices by virtue of its superior performance, and it is very important to accurately measure its electrical and optical properties. In this study, a semi- insulation (SI) GaAs wafer is investigated by the terahertz (THz) non-destruc...

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Bibliographic Details
Published inChinese physics letters Vol. 33; no. 12; pp. 23 - 27
Main Author 韩小卫 侯磊 杨磊 王志全 赵萌萌 施卫
Format Journal Article
LanguageEnglish
Published 01.12.2016
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