An experimental study of the main involved parameters in the epitaxial growth of CeO2 buffer layers on nickel tapes
In order to investigate the optimal conditions for highly oriented and epitaxial buffer layers on Ni based tapes, authors have grown several sequences of CeO2 films by PLD technique. Among the usual parameters governing this procedure to obtain high quality buffer layers, three of them received atte...
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Published in | Physica. C, Superconductivity Vol. 366; no. 2; pp. 109 - 116 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
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01.01.2002
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Abstract | In order to investigate the optimal conditions for highly oriented and epitaxial buffer layers on Ni based tapes, authors have grown several sequences of CeO2 films by PLD technique. Among the usual parameters governing this procedure to obtain high quality buffer layers, three of them received attention through this work: target-substrate distance, buffer layer deposition temperature, and gas atmosphere inside the vacuum chamber during the growing process. Based on the following results, authors found a full crossed relation among them, which develops in obtaining textured layers of highly oriented CeO2 along the (001) ordered Ni substrate. 16 refs. |
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AbstractList | In order to investigate the optimal conditions for highly oriented and epitaxial buffer layers on Ni based tapes, authors have grown several sequences of CeO2 films by PLD technique. Among the usual parameters governing this procedure to obtain high quality buffer layers, three of them received attention through this work: target-substrate distance, buffer layer deposition temperature, and gas atmosphere inside the vacuum chamber during the growing process. Based on the following results, authors found a full crossed relation among them, which develops in obtaining textured layers of highly oriented CeO2 along the (001) ordered Ni substrate. 16 refs. |
Author | Holzapfel, B. Schultz, L. Arranz, M.A. Eickemeyer, J. Reger, N. |
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CitedBy_id | crossref_primary_10_1016_j_matlet_2005_11_067 crossref_primary_10_1016_j_jcrysgro_2005_07_034 crossref_primary_10_1016_j_tsf_2006_07_009 crossref_primary_10_1088_0953_2048_21_01_015003 crossref_primary_10_1016_j_jssc_2008_08_031 crossref_primary_10_1002_ejic_200600616 crossref_primary_10_1016_j_mseb_2003_09_019 |
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