A measuring method of standard resistance and analysis of measuring results

DC standard resistance is widely used in precision measurement, verification, traceability and other fields due to its high accuracy and good stability. First-class resistance standard has used to measure it based on the bridge turn equilibrium principle. According to JJF1059.1–2012 Evaluation and e...

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Published inMeasurement. Sensors Vol. 18; p. 100207
Main Authors Guan, Zexin, XinyanWang, Mei Yang, Li, Wenqiang, Sun, Xiaoyan, Wang, Dalong, Wang, Shang
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.12.2021
Elsevier
Subjects
Ampere turn balance
DC standard Resistor
Measurement results
Uncertainty evaluation
Uncertainty evaluation
DC standard Resistor
Ampere turn balance
Measurement results
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Abstract DC standard resistance is widely used in precision measurement, verification, traceability and other fields due to its high accuracy and good stability. First-class resistance standard has used to measure it based on the bridge turn equilibrium principle. According to JJF1059.1–2012 Evaluation and expression of uncertainty in measurement, the uncertainty of measurement results has been evaluated on uncertainty of the transfer standard, the basic error, sensitivity, load power, tank temperature, thermoelectric power and staff. This paper analyzes the uncertainty of the measurement results which will useful to measurement uncertainty assessment of standard resistance in future testing work.
AbstractList DC standard resistance is widely used in precision measurement, verification, traceability and other fields due to its high accuracy and good stability. First-class resistance standard has used to measure it based on the bridge turn equilibrium principle. According to JJF1059.1–2012 Evaluation and expression of uncertainty in measurement, the uncertainty of measurement results has been evaluated on uncertainty of the transfer standard, the basic error, sensitivity, load power, tank temperature, thermoelectric power and staff. This paper analyzes the uncertainty of the measurement results which will useful to measurement uncertainty assessment of standard resistance in future testing work.
ArticleNumber 100207
Author Li, Wenqiang
Wang, Shang
Wang, Dalong
Sun, Xiaoyan
Guan, Zexin
XinyanWang, Mei Yang
Author_xml – sequence: 1
  givenname: Zexin
  surname: Guan
  fullname: Guan, Zexin
  email: 13256115120@163.com
– sequence: 2
  givenname: Mei Yang
  surname: XinyanWang
  fullname: XinyanWang, Mei Yang
– sequence: 3
  givenname: Wenqiang
  surname: Li
  fullname: Li, Wenqiang
– sequence: 4
  givenname: Xiaoyan
  surname: Sun
  fullname: Sun, Xiaoyan
– sequence: 5
  givenname: Dalong
  surname: Wang
  fullname: Wang, Dalong
– sequence: 6
  givenname: Shang
  surname: Wang
  fullname: Wang, Shang
BookMark eNp9kMtOwzAURC1UJErpH7DID6T4lTjZIFUVj4pKbLq3_LgujtIE2SlS_x6HIGDFwvL1aObYnms06_oOELoleEUwKe-a1RFUhG5FMSVJwhSLCzSnZVnkNRF89me-QssYG5w8VcpSPkcv62yMn4LvDmka3nqb9S6Lg-qsCjYLEP14MJAlJS3VnpMyen5zyXRqh3iDLp1qIyy_9wXaPz7sN8_57vVpu1nvckMrKnJRc146XhNHmcFYu6qGwpQ1rpgqmC2KokwaaEoFA12DcZozzgDXjtuKsQXaTljbq0a-B39U4Sx75eWX0IeDVGHwpgVp041KmNIIUFwLrRUXoioYt0RDbUli8YllQh9jAPfDI1iO9cpGTvXKsV451Zti91MM0jc_PAQZjYdUkvUBzJAe4v8HfAJ-bobf
ContentType Journal Article
Copyright 2021
Copyright_xml – notice: 2021
DBID 6I.
AAFTH
AAYXX
CITATION
DOA
DOI 10.1016/j.measen.2021.100207
DatabaseName ScienceDirect Open Access Titles
Elsevier:ScienceDirect:Open Access
CrossRef
Directory of Open Access Journals (DOAJ)
DatabaseTitle CrossRef
DatabaseTitleList

Database_xml – sequence: 1
  dbid: DOA
  name: DOAJ Directory of Open Access Journals
  url: https://www.doaj.org/
  sourceTypes: Open Website
DeliveryMethod fulltext_linktorsrc
EISSN 2665-9174
ExternalDocumentID oai_doaj_org_article_dc28a7c6c7ea4b7bba4778534d1be9d1
10_1016_j_measen_2021_100207
S2665917421001707
GroupedDBID 0SF
53G
6I.
AAEDW
AAFTH
AALRI
AAXUO
AITUG
ALMA_UNASSIGNED_HOLDINGS
AMRAJ
EBS
EJD
FDB
GROUPED_DOAJ
M41
M~E
NCXOZ
OK1
ROL
AAYXX
ADVLN
AFJKZ
CITATION
ID FETCH-LOGICAL-c2827-79446f491f23c00bf89e5c69083a53d5556bf8eb2273eb9ecfb4343e09f4d833
IEDL.DBID DOA
ISSN 2665-9174
IngestDate Fri Oct 04 13:15:24 EDT 2024
Thu Sep 26 19:56:17 EDT 2024
Fri Feb 23 02:40:29 EST 2024
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Keywords Uncertainty evaluation
DC standard Resistor
Ampere turn balance
Measurement results
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c2827-79446f491f23c00bf89e5c69083a53d5556bf8eb2273eb9ecfb4343e09f4d833
OpenAccessLink https://doaj.org/article/dc28a7c6c7ea4b7bba4778534d1be9d1
ParticipantIDs doaj_primary_oai_doaj_org_article_dc28a7c6c7ea4b7bba4778534d1be9d1
crossref_primary_10_1016_j_measen_2021_100207
elsevier_sciencedirect_doi_10_1016_j_measen_2021_100207
PublicationCentury 2000
PublicationDate December 2021
2021-12-00
2021-12-01
PublicationDateYYYYMMDD 2021-12-01
PublicationDate_xml – month: 12
  year: 2021
  text: December 2021
PublicationDecade 2020
PublicationTitle Measurement. Sensors
PublicationYear 2021
Publisher Elsevier Ltd
Elsevier
Publisher_xml – name: Elsevier Ltd
– name: Elsevier
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  contributor:
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SSID ssj0002810124
Score 2.2211437
Snippet DC standard resistance is widely used in precision measurement, verification, traceability and other fields due to its high accuracy and good stability....
SourceID doaj
crossref
elsevier
SourceType Open Website
Aggregation Database
Publisher
StartPage 100207
SubjectTerms Ampere turn balance
DC standard Resistor
Measurement results
Uncertainty evaluation
Title A measuring method of standard resistance and analysis of measuring results
URI https://dx.doi.org/10.1016/j.measen.2021.100207
https://doaj.org/article/dc28a7c6c7ea4b7bba4778534d1be9d1
Volume 18
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV07T8MwELZQJxYEAkR5yQNrRP2K47GgVhWoTEXqFvkpUdEWQbvy27mLG8gEC0MixXLs6Dsrd9_5fEfIjXWO2QQ0NSQhCqkSg_-grQpYCkoDaTbeo2tg-lROnuXDXM07pb4wJiynB87A3QbPK6t96XW00mnnrNQadIwMzEUTMvFhqkOmFo3LCPNW4ZYyKCAsRqhle26uCe5a4t4Hpj_lrElCitVkO3qpSd_fUU8dlTM-JAc7W5EO8zcekb24OiaPQ7ps_Hqgc2iu_0zXibYuAQr0GU1CkCWFFrhy0hHs8_MedNq-bj5OyGw8mt1Pil1FhAJQ4BoQBPaWpGGJCz8YuFSZqDwQ3EpYJYJSqoQ2IMtglERnok8OT47GgUkyVEKckt5qvYpnhMIDt4LxFEwpAy8tFq5iAHY0CUgx75OihaN-y3kv6jYgbFFn-GqEr87w9ckdYvbdF7NWNw0gy3ony_ovWfaJbhGvdwZAVuww1Muv05__x_QXZB-HzMEql6S3ed_GKzA5Nu66WV1wn36OvgDnkdPu
link.rule.ids 315,786,790,870,2115,27955,27956
linkProvider Directory of Open Access Journals
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+measuring+method+of+standard+resistance+and+analysis+of+measuring+results&rft.jtitle=Measurement.+Sensors&rft.au=Guan%2C+Zexin&rft.au=XinyanWang%2C+Mei+Yang&rft.au=Li%2C+Wenqiang&rft.au=Sun%2C+Xiaoyan&rft.date=2021-12-01&rft.pub=Elsevier+Ltd&rft.issn=2665-9174&rft.eissn=2665-9174&rft.volume=18&rft_id=info:doi/10.1016%2Fj.measen.2021.100207&rft.externalDocID=S2665917421001707
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2665-9174&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2665-9174&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2665-9174&client=summon