Amorphous copper iodide: a p-type semiconductor for solution processed p-channel thin-film transistors and inverters
Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio compared to their n-channel counterparts. For inorganic p-channel TFTs, high-temperature annealed single- or poly-crystalline materials such as C...
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Published in | Journal of materials chemistry. C, Materials for optical and electronic devices Vol. 1; no. 2; pp. 7815 - 7821 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Cambridge
Royal Society of Chemistry
26.05.2022
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Abstract | Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio compared to their n-channel counterparts. For inorganic p-channel TFTs, high-temperature annealed single- or poly-crystalline materials such as CuO, SnO, or 2D dichalcogenides have been the typical materials of choice. Development of amorphous semiconductor materials can provide a wide range of promising semiconductors for the TFT industry owing to their unique advantages, such as large area applicability, high device-to-device uniformity, and low temperature processing; however, the poor TFT performance using the conventional amorphous p-type semiconductors limits the use of materials in practical applications. In the present work, we demonstrate the 1st high-performance solution-processed p-channel TFT using an amorphous copper iodide (a-CuI) semiconductor, which outperforms its polycrystalline counterpart. Amorphous CuI films were formed by spin coating of precursor solutions based on co-solvents. By using a-CuI semiconductors as the channel layer, electrolyte-gated p-channel TFTs were fabricated with a vertical device structure. Measurement of the TFT characteristics reveals that the amorphous CuI channel layer leads to better device performance than devices with a polycrystalline CuI. The optimized vertical TFTs showed high current densities above 1000 mA cm
−2
, ON/OFF current ratios of > 10
4
, and large normalized transconductances of about 6 S m
−1
, which are the highest among solution-processed vertical TFTs. These results pave the way for application of amorphous p-type inorganics in high-performance complementary circuits and represent a breakthrough for p-type semiconductor materials.
Amorphous p-type copper iodide (a-CuI) semiconductor and corresponding p-channel vertical TFTs are demonstrated. The a-CuI-TFTs exhibit excellent device performance, high current density of 1400 mA cm
−2
and normalized transconductance of 6.46 S m
−1
. |
---|---|
AbstractList | Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio compared to their n-channel counterparts. For inorganic p-channel TFTs, high-temperature annealed single- or poly-crystalline materials such as CuO, SnO, or 2D dichalcogenides have been the typical materials of choice. Development of amorphous semiconductor materials can provide a wide range of promising semiconductors for the TFT industry owing to their unique advantages, such as large area applicability, high device-to-device uniformity, and low temperature processing; however, the poor TFT performance using the conventional amorphous p-type semiconductors limits the use of materials in practical applications. In the present work, we demonstrate the 1st high-performance solution-processed p-channel TFT using an amorphous copper iodide (a-CuI) semiconductor, which outperforms its polycrystalline counterpart. Amorphous CuI films were formed by spin coating of precursor solutions based on co-solvents. By using a-CuI semiconductors as the channel layer, electrolyte-gated p-channel TFTs were fabricated with a vertical device structure. Measurement of the TFT characteristics reveals that the amorphous CuI channel layer leads to better device performance than devices with a polycrystalline CuI. The optimized vertical TFTs showed high current densities above 1000 mA cm
−2
, ON/OFF current ratios of > 10
4
, and large normalized transconductances of about 6 S m
−1
, which are the highest among solution-processed vertical TFTs. These results pave the way for application of amorphous p-type inorganics in high-performance complementary circuits and represent a breakthrough for p-type semiconductor materials. Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio compared to their n-channel counterparts. For inorganic p-channel TFTs, high-temperature annealed single- or poly-crystalline materials such as CuO, SnO, or 2D dichalcogenides have been the typical materials of choice. Development of amorphous semiconductor materials can provide a wide range of promising semiconductors for the TFT industry owing to their unique advantages, such as large area applicability, high device-to-device uniformity, and low temperature processing; however, the poor TFT performance using the conventional amorphous p-type semiconductors limits the use of materials in practical applications. In the present work, we demonstrate the 1st high-performance solution-processed p-channel TFT using an amorphous copper iodide (a-CuI) semiconductor, which outperforms its polycrystalline counterpart. Amorphous CuI films were formed by spin coating of precursor solutions based on co-solvents. By using a-CuI semiconductors as the channel layer, electrolyte-gated p-channel TFTs were fabricated with a vertical device structure. Measurement of the TFT characteristics reveals that the amorphous CuI channel layer leads to better device performance than devices with a polycrystalline CuI. The optimized vertical TFTs showed high current densities above 1000 mA cm−2, ON/OFF current ratios of > 104, and large normalized transconductances of about 6 S m−1, which are the highest among solution-processed vertical TFTs. These results pave the way for application of amorphous p-type inorganics in high-performance complementary circuits and represent a breakthrough for p-type semiconductor materials. Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio compared to their n-channel counterparts. For inorganic p-channel TFTs, high-temperature annealed single- or poly-crystalline materials such as CuO, SnO, or 2D dichalcogenides have been the typical materials of choice. Development of amorphous semiconductor materials can provide a wide range of promising semiconductors for the TFT industry owing to their unique advantages, such as large area applicability, high device-to-device uniformity, and low temperature processing; however, the poor TFT performance using the conventional amorphous p-type semiconductors limits the use of materials in practical applications. In the present work, we demonstrate the 1st high-performance solution-processed p-channel TFT using an amorphous copper iodide (a-CuI) semiconductor, which outperforms its polycrystalline counterpart. Amorphous CuI films were formed by spin coating of precursor solutions based on co-solvents. By using a-CuI semiconductors as the channel layer, electrolyte-gated p-channel TFTs were fabricated with a vertical device structure. Measurement of the TFT characteristics reveals that the amorphous CuI channel layer leads to better device performance than devices with a polycrystalline CuI. The optimized vertical TFTs showed high current densities above 1000 mA cm −2 , ON/OFF current ratios of > 10 4 , and large normalized transconductances of about 6 S m −1 , which are the highest among solution-processed vertical TFTs. These results pave the way for application of amorphous p-type inorganics in high-performance complementary circuits and represent a breakthrough for p-type semiconductor materials. Amorphous p-type copper iodide (a-CuI) semiconductor and corresponding p-channel vertical TFTs are demonstrated. The a-CuI-TFTs exhibit excellent device performance, high current density of 1400 mA cm −2 and normalized transconductance of 6.46 S m −1 . |
Author | Lee, Han Ju Lee, Keun Hyung Hong, Kihyon Lee, Seonjeong |
AuthorAffiliation | Chungnam National University Inha University Education and Research Center for Smart Energy and Materials Department of Materials Science and Engineering Department of Chemistry and Chemical Engineering |
AuthorAffiliation_xml | – name: Department of Chemistry and Chemical Engineering – name: Inha University – name: Chungnam National University – name: Education and Research Center for Smart Energy and Materials – name: Department of Materials Science and Engineering |
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CitedBy_id | crossref_primary_10_3390_molecules29081723 crossref_primary_10_1038_s41586_024_07360_w crossref_primary_10_1039_D4TC00203B crossref_primary_10_1016_j_matlet_2023_134112 crossref_primary_10_1021_acsaelm_3c01224 crossref_primary_10_1021_acs_chemmater_3c01628 |
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Snippet | Until now, inorganic p-channel thin-film transistors (TFTs) have shown relatively low performance in terms of mobility, ON-current level, and on/off ratio... |
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SubjectTerms | Amorphous materials Amorphous semiconductors Copper High temperature Low temperature P-type semiconductors Polycrystals Semiconductor devices Semiconductor materials Semiconductors Spin coating Thin film transistors Transistors |
Title | Amorphous copper iodide: a p-type semiconductor for solution processed p-channel thin-film transistors and inverters |
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