Critical Performance Analysis of HTS Magnet Wires Using an Induced Current-Based Measurement System

Studies on wide and stacked high-temperature superconducting (HTS) wires aim to increase the critical current of the wires. This paper describes the design and fabrication of an induced current-based performance measurement system and a critical performance analysis of HTS magnet wires using this sy...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 26; no. 4; pp. 1 - 5
Main Authors Go, B. S., Kim, K., Jeong, S. H., Lee, H., Park, M., Yu, I. K.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2016
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Studies on wide and stacked high-temperature superconducting (HTS) wires aim to increase the critical current of the wires. This paper describes the design and fabrication of an induced current-based performance measurement system and a critical performance analysis of HTS magnet wires using this system. In the experiment, the induced current, critical current, and joint resistance of stacked HTS wires under charge and discharge conditions were investigated. The results obtained were compared with those achieved using the four-terminal method, which is the conventional measurement method. The measurement system and the results of the critical performance analysis of the HTS wire are discussed in detail.
AbstractList Studies on wide and stacked high-temperature superconducting (HTS) wires aim to increase the critical current of the wires. This paper describes the design and fabrication of an induced current-based performance measurement system and a critical performance analysis of HTS magnet wires using this system. In the experiment, the induced current, critical current, and joint resistance of stacked HTS wires under charge and discharge conditions were investigated. The results obtained were compared with those achieved using the four-terminal method, which is the conventional measurement method. The measurement system and the results of the critical performance analysis of the HTS wire are discussed in detail.
Author Lee, H.
Go, B. S.
Kim, K.
Jeong, S. H.
Park, M.
Yu, I. K.
Author_xml – sequence: 1
  givenname: B. S.
  surname: Go
  fullname: Go, B. S.
  organization: Dept. of Electr. Eng., Changwon Nat. Univ., Changwon, South Korea
– sequence: 2
  givenname: K.
  surname: Kim
  fullname: Kim, K.
  organization: Dept. of Electr. Eng., Changwon Nat. Univ., Changwon, South Korea
– sequence: 3
  givenname: S. H.
  surname: Jeong
  fullname: Jeong, S. H.
  organization: Dept. of Mater. Sci. & Eng., Korea Univ., Seoul, South Korea
– sequence: 4
  givenname: H.
  surname: Lee
  fullname: Lee, H.
  email: Haigunlee@korea.ac.kr
  organization: Dept. of Mater. Sci. & Eng., Korea Univ., Seoul, South Korea
– sequence: 5
  givenname: M.
  surname: Park
  fullname: Park, M.
  organization: Dept. of Electr. Eng., Changwon Nat. Univ., Changwon, South Korea
– sequence: 6
  givenname: I. K.
  surname: Yu
  fullname: Yu, I. K.
  email: yuik@cwnu.ac.kr
  organization: Dept. of Electr. Eng., Changwon Nat. Univ., Changwon, South Korea
BookMark eNpdkMtKxDAUhoMoeH0AcRNw46ZjTi5NsxyLN1AUZgaXJc2cSKVNNWkX8_Z2mMGFq3Ph-w-c75Qchj4gIZfAZgDM3C7ni3LGGeQzrqQUSh-QE1CqyLgCdTj1TEFWcC6OyWlKX4yBLKQ6Ia6MzdA429J3jL6PnQ0O6TzYdpOaRHtPn5YL-mo_Aw70o4mY6Co14ZPaQJ_DenS4puUYI4Yhu7Npml7RpjFiN23oYpMG7M7Jkbdtwot9PSOrh_tl-ZS9vD0-l_OXzHFdDJmwoGXumTa101DnmnttrGBCI0ghclcbp8w6rwuvuVNWGylrKWTOuWFeenFGbnZ3v2P_M2Iaqq5JDtvWBuzHVEHBlcqNATGh1__Qr36M09cTpQsNihkBEwU7ysU-pYi--o5NZ-OmAlZttVdb7dVWe7XXPmWudpkGEf94LYWWLBe_iOx-Tg
CODEN ITASE9
Cites_doi 10.1109/TED.2010.2079170
10.1109/JPROC.2009.2030239
10.1109/TASC.2013.2289356
10.1109/TASC.2009.2017701
10.1146/annurev-matsci-100511-100240
10.1109/TASC.2011.2176290
10.1109/TASC.2004.830273
10.1016/j.physc.2007.04.239
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
F28
FR3
DOI 10.1109/TASC.2016.2544357
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Solid State and Superconductivity Abstracts

Solid State and Superconductivity Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore Digital Library
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1558-2515
EndPage 5
ExternalDocumentID 4046973551
10_1109_TASC_2016_2544357
7437406
Genre orig-research
GrantInformation_xml – fundername: Ministry of Trade, Industry, & Energy, Republic of Korea
  grantid: 20142020103560
– fundername: Power Generation & Electricity Delivery Core Technology Program of the Korea Institute of Energy Technology Evaluation and Planning (KETEP)
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
DU5
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
PZZ
RIA
RIE
RIG
RNS
TN5
VH1
XFK
AAYXX
CITATION
7SP
7U5
8FD
L7M
F28
FR3
ID FETCH-LOGICAL-c278t-3a1746f079bc71b672f79a3037e14336cb9c59d6b8f72c5a7944b43462290f4f3
IEDL.DBID RIE
ISSN 1051-8223
IngestDate Wed Jul 24 12:19:59 EDT 2024
Fri Sep 13 02:03:22 EDT 2024
Fri Aug 23 01:01:44 EDT 2024
Wed Jun 26 19:28:41 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 4
Keywords wide and stacked wires
high-temperature superconductors
Critical current
induced current
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c278t-3a1746f079bc71b672f79a3037e14336cb9c59d6b8f72c5a7944b43462290f4f3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
PQID 1787150931
PQPubID 85434
PageCount 5
ParticipantIDs crossref_primary_10_1109_TASC_2016_2544357
ieee_primary_7437406
proquest_journals_1787150931
proquest_miscellaneous_1825569913
PublicationCentury 2000
PublicationDate 2016-06-01
PublicationDateYYYYMMDD 2016-06-01
PublicationDate_xml – month: 06
  year: 2016
  text: 2016-06-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on applied superconductivity
PublicationTitleAbbrev TASC
PublicationYear 2016
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref8
wen (ref5) 2014
abrahamsen (ref6) 2009
ref9
ref4
ref3
shirun (ref7) 2010; 57
ref10
ref2
ref1
References_xml – volume: 57
  start-page: 3377
  year: 2010
  ident: ref7
  article-title: Emission time constant of exoelectron and formative delay time analyzed by using discharge probability distribution
  publication-title: IEEE Trans Appl Electron Device
  doi: 10.1109/TED.2010.2079170
  contributor:
    fullname: shirun
– ident: ref2
  doi: 10.1109/JPROC.2009.2030239
– ident: ref9
  doi: 10.1109/TASC.2013.2289356
– start-page: 826
  year: 2014
  ident: ref5
  article-title: Simulation and analysis of oil-immersed transformer based on thermal-fluid coupled field
  publication-title: Proc IEEE Power Syst Technol
  contributor:
    fullname: wen
– ident: ref8
  doi: 10.1109/TASC.2009.2017701
– ident: ref4
  doi: 10.1146/annurev-matsci-100511-100240
– start-page: 1
  year: 2009
  ident: ref6
  article-title: Dynamic study of the time constant in high intensity discharge lam
  publication-title: Proceedings IEEE Trans Electron Devices
  contributor:
    fullname: abrahamsen
– ident: ref10
  doi: 10.1109/TASC.2011.2176290
– ident: ref3
  doi: 10.1109/TASC.2004.830273
– ident: ref1
  doi: 10.1016/j.physc.2007.04.239
SSID ssj0014845
Score 2.14487
Snippet Studies on wide and stacked high-temperature superconducting (HTS) wires aim to increase the critical current of the wires. This paper describes the design and...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Publisher
StartPage 1
SubjectTerms Charge
Coils
Critical current
Critical current density (superconductivity)
Current measurement
Design analysis
Design engineering
Discharge
Electrical resistance measurement
High-temperature superconductors
Hightemperature superconductors
Induced current
Measurement methods
Performance measurement
Superconducting magnets
Superconductivity
Wide and stacked wires
Wire
Wires
Title Critical Performance Analysis of HTS Magnet Wires Using an Induced Current-Based Measurement System
URI https://ieeexplore.ieee.org/document/7437406
https://www.proquest.com/docview/1787150931/abstract/
https://search.proquest.com/docview/1825569913
Volume 26
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1BaxQxFH7UgqAHq63SbatE8CRmO5lkJsmxFssirAjdQm_DJHnxIMyKO3vpr_clM7Mt1YO3gQlJyEvyveR9-R7Ah-C8TwKQXHuDXEn03JUt8lBZL4MoXBXT1cDyW724UV9vq9s9-LR7C4OImXyG8_SZY_lh7bfpquyc0E6rpK_9xBTl8FZrFzFQJickJndBcAI9OUYwRWHPVxfXl4nEVc-THpdMSPQAg3JSlb924gwvVwewnDo2sEp-zre9m_u7R5qN_9vzl_Bi9DPZxTAxXsEedofw_IH64CE8zexPvzkCPyU8YN_v3xGwSa-ErSNbrK7Zsv3RYc8SX3bDMtWAtR1LuT88BjYKPfHPBIuBLe-vHtkgiv4abq6-rC4XfMy-wH2pTc9lS4eVOhbaOq-Fq3UZtW0J8TSSjyVr76yvbKidibr0VUsLWzklVZ0U5KOK8g3sd-sOj4HZwqFBUUfUQnljXAxFS5MjCIGG_IcZfJzs0fwaRDaafDgpbJOM1yTjNaPxZnCUxndXcBzaGZxNFmzGZbhpBG1H5PFaSU283_2mBZSiIm2H6y2VMUmFjdxkefLvmk_hWWp_4IedwX7_e4tvyRPp3bs8Bf8A9QTZ-w
link.rule.ids 315,786,790,802,27957,27958,55109
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BbtQwEB1VRQh6KNCC2FLASJwQ3iZrJ7aPbUW1QFMhdSv1FsX2uAekLOpmL3w9YyfZVsCht0ixEssz9nv2jN8AfPTWuSgAyZXTyKVAx-2sQe4L44TPM1uEeDRQXZTzK_nturjegs-buzCImJLPcBofUyzfL906HpUdEdopGfW1HxHOZ6a_rbWJGUidShITYcg5wZ4YYpjU8GhxfHka07jKaVTkEhGL7qFQKqvyz1qcAObsGVRj1_q8kp_TdWen7vdfqo0P7ftz2B2YJjvuXeMFbGG7Bzv39Af34HHK_3SrfXBjyQP24-4mARsVS9gysPniklXNTYsdixmzK5aSDVjTslj9w6Fng9QTPyFg9Ky6O3xkvSz6S7g6-7I4nfOh_gJ3M6U7LhrarpQhU8Y6ldtSzYIyDWGeQmJZonTWuML40uqgZq5oaGpLK4Uso4Z8kEG8gu122eJrYCazqDEvA6pcOq1t8FlD7uHzHDUxiAl8Gu1R_-plNuq0PclMHY1XR-PVg_EmsB_Hd9NwGNoJHI4WrIeJuKpzWpCI8xpBv_iweU1TKMZFmhaXa2qjow4bEWVx8P8vv4cn80V1Xp9_vfj-Bp7GvvTZYoew3d2u8S3xks6-S-74B6Bj3VE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Critical+Performance+Analysis+of+HTS+Magnet+Wires+Using+an+Induced+Current-Based+Measurement+System&rft.jtitle=IEEE+transactions+on+applied+superconductivity&rft.au=Go%2C+B+S&rft.au=Kim%2C+K&rft.au=Jeong%2C+SH&rft.au=Lee%2C+H&rft.date=2016-06-01&rft.issn=1051-8223&rft.eissn=1558-2515&rft.volume=26&rft.issue=4&rft.spage=1&rft.epage=5&rft_id=info:doi/10.1109%2FTASC.2016.2544357&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-8223&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-8223&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-8223&client=summon