Multi-Modal Dynamic Fusion for Defect Detection in Electronic Products: A Novel Approach Based on Energy and Deep Learning - Liu, Yulin; Gao, Yang (IEEE access, 2025)
Keywords: Accuracy; Artificial neural networks; Convolutional neural networks; Data analysis; Data models; Defect detection; Defects; Image sensors; Machine learning; Manufacturing; Multi-modal fusion; Multilayer perceptrons; Multilayers; Performance measurement; Quality assurance; quality control; Quality standards; Sensor phenomena and characterization; Sensors; Soft sensors; transformer; Transformers; Uncertainty