APA (7th ed.) Citation

Wei, Y., & Wang, H. (2023). Wavelet integrated attention network with multi-resolution frequency learning for mixed-type wafer defect recognition. Engineering applications of artificial intelligence, 121, 105975. https://doi.org/10.1016/j.engappai.2023.105975

Chicago Style (17th ed.) Citation

Wei, Yuxiang, and Huan Wang. "Wavelet Integrated Attention Network with Multi-resolution Frequency Learning for Mixed-type Wafer Defect Recognition." Engineering Applications of Artificial Intelligence 121 (2023): 105975. https://doi.org/10.1016/j.engappai.2023.105975.

MLA (9th ed.) Citation

Wei, Yuxiang, and Huan Wang. "Wavelet Integrated Attention Network with Multi-resolution Frequency Learning for Mixed-type Wafer Defect Recognition." Engineering Applications of Artificial Intelligence, vol. 121, 2023, p. 105975, https://doi.org/10.1016/j.engappai.2023.105975.