The dual electron emission spectromicroscope: a novel multi-technique instrument for surface analysis

• Published in: Surface science Vol. 566; no. 2; pp. 869 - 874
• Main Author: Grzelakowski, Krzysztof
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 20.09.2004
• Subjects: Electron emission; Photoemission (total yield); Secondary electron emission; X-ray photoelectron spectroscopy; Secondary electron emission; Electron emission; Photoemission (total yield); X-ray photoelectron spectroscopy

The concept, design and performance of the novel dual emission electron spectromicroscope (DEEM) are presented. The DEEM consists of four fully electrostatic lens systems comprising two independent and parallel projective columns, objective lens system and deflector lens system. Switching on the def...