A general formulation for connecting sources and passive lumped-circuit elements across multiple 3-D FDTD cells

• Published in: IEEE microwave and guided wave letters Vol. 6; no. 2; pp. 85 - 87
• Main Authors: Durney, C.H., Wenquan Sui, Christensen, D.A., Jingyi Zhu
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.02.1996; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Circuit properties; Cities and towns; Dielectric devices; Distributed parameter circuits; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Finite difference methods; Integral equations; Joining processes; Maxwell equations; Microwave circuits; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Time domain analysis; Microstrip line; Transmission line; Time domain method; Lumped parameter circuit; Theoretical study; Parallel connection; Microwave circuit; Resistor; Finite difference method
• DOI: 10.1109/75.481997
• ISSN: 1051-8207

A previous extension of the finite-difference time-domain (FDTD) method to include lumpedcircuit elements is further extended to model lumped-element circuits connected across multiple FDTD cells. This formulation is needed to model many kinds of circuits, like those with a transistor or other active device connected across a transmission line with more than one dielectric. The FDTD analysis of a shielded suspended microstrip transmission line excited by a current source in parallel with a resistance illustrates the usefulness of the formulation.