Lithium intercalation into amorphous-silicon thin films: An electrochemical-impedance study

Lithium intercalation into 0.25-μm-thick films of amorphous silicon is studied using the electrochemical-impedance technique. An equivalent circuit, proposed for such electrodes, comprises the electrolyte resistance and three units connected in series, each unit being a parallel combination of a res...

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Bibliographic Details
Published inRussian journal of electrochemistry Vol. 42; no. 7; pp. 708 - 714
Main Authors Kulova, T. L., Pleskov, Yu. V., Skundin, A. M., Terukov, E. I., Kon’kov, O. I.
Format Journal Article
LanguageEnglish
Published New York Springer Nature B.V 01.07.2006
Subjects
Amorphous silicon
Charge transfer
Diffusion coefficient
Electrolytes
Equivalent circuits
Impedance
Intercalation
Lithium
Silicon
Silicon films
Thick films
Thin films
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Summary:Lithium intercalation into 0.25-μm-thick films of amorphous silicon is studied using the electrochemical-impedance technique. An equivalent circuit, proposed for such electrodes, comprises the electrolyte resistance and three units connected in series, each unit being a parallel combination of a resistance and a constant-phase element. The units relate to the charge transfer processes at the silicon/electrolyte interface, charge transfer though the passive film on the silicon, and the lithium diffusion into the silicon bulk. During potential cycling, changes occur largely in the unit related to the passive film. The lithium diffusion coefficient in the amorphous silicon is estimated as ∼ 10−13 cm2 s−1.
ISSN:1023-1935
1608-3342
DOI:10.1134/S1023193506070032