RETRACTED: Cross- and in-plane thermal conductivity of AlN thin films measured using differential 3-omega method
This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief and the corresponding author. The corresponding author has misused Fig. 6...
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| Published in | Surface & coatings technology Vol. 320; pp. 91 - 96 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
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Elsevier B.V
01.06.2017
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| Abstract | This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal).
This article has been retracted at the request of the Editor-in-Chief and the corresponding author. The corresponding author has misused Fig. 6 and Fig. 7. Figure 6 shows three surfaces of AlN layers on silicon obtained by Atomic Force Microscopy (AFM), while Fig. 7 presents a respective example of a cross-section obtained by Transmission Electron Microscopy (TEM). Both were published previously in a different form (https://doi.org/10.1063/1.4748048.) and were manipulated and misused in the present paper. The corresponding author, Manuel Bogner, has taken full responsibility for the misuse of the images and apologizes for the academic misconduct. |
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| AbstractList | This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal).
This article has been retracted at the request of the Editor-in-Chief and the corresponding author. The corresponding author has misused Fig. 6 and Fig. 7. Figure 6 shows three surfaces of AlN layers on silicon obtained by Atomic Force Microscopy (AFM), while Fig. 7 presents a respective example of a cross-section obtained by Transmission Electron Microscopy (TEM). Both were published previously in a different form (https://doi.org/10.1063/1.4748048.) and were manipulated and misused in the present paper. The corresponding author, Manuel Bogner, has taken full responsibility for the misuse of the images and apologizes for the academic misconduct. |
| Author | Benstetter, Günther Bogner, Manuel Fu, Yong Qing |
| Author_xml | – sequence: 1 givenname: Manuel surname: Bogner fullname: Bogner, Manuel email: manuel.bogner@th-deg.de organization: Deggendorf Institute of Technology, Edlmairstr. 6+8, 94469 Deggendorf, Germany – sequence: 2 givenname: Günther orcidid: 0000-0001-7625-1293 surname: Benstetter fullname: Benstetter, Günther organization: Deggendorf Institute of Technology, Edlmairstr. 6+8, 94469 Deggendorf, Germany – sequence: 3 givenname: Yong Qing surname: Fu fullname: Fu, Yong Qing email: richard.fu@northumbria.ac.uk organization: Faculty of Engineering and Environment, Northumbria University, Newcastle upon Tyne NE1 8ST, UK |
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| CitedBy_id | crossref_primary_10_3390_s19153414 crossref_primary_10_1016_j_surfcoat_2018_07_052 crossref_primary_10_1016_j_tsf_2019_02_023 crossref_primary_10_1021_acsami_0c09253 crossref_primary_10_1088_1361_6641_abc8ad crossref_primary_10_1007_s10973_020_09612_z crossref_primary_10_1021_acsami_8b02899 crossref_primary_10_1080_14686996_2018_1460177 crossref_primary_10_3390_nano10061239 crossref_primary_10_1016_j_actamat_2021_116896 crossref_primary_10_15407_mfint_44_08_0989 crossref_primary_10_15407_dopovidi2018_03_059 crossref_primary_10_15407_ufm_24_02_239 crossref_primary_10_1016_j_ijthermalsci_2019_106259 |
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| Title | RETRACTED: Cross- and in-plane thermal conductivity of AlN thin films measured using differential 3-omega method |
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