Remote Optical Temperature Sensing Using a Flat-Parallel Dielectric Wafer

It is demonstrated that reflection of a continuous-wave single-frequency laser radiation from a thick flat-parallel glass wafer can be used for precise remote measurement of temperature. Such measurement relies on the low-finesse Fabry-Pérot nature of the dielectric wafer, whose optical thickness de...

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Bibliographic Details
Published inJournal of contemporary physics Vol. 56; no. 3; pp. 192 - 195
Main Authors Harutyunyan, V. A., Papoyan, A. V.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.07.2021
Springer Nature B.V
Subjects
Continuous radiation
Dielectrics
Optical thickness
Particle and Nuclear Physics
Physics
Physics and Astronomy
Refractivity
Remote sensing
Temperature sensors
Thermal expansion
Wave reflection
glass wafer
remote optical sensing
Fabry-Pérot interferometer
single-frequency laser
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Summary:It is demonstrated that reflection of a continuous-wave single-frequency laser radiation from a thick flat-parallel glass wafer can be used for precise remote measurement of temperature. Such measurement relies on the low-finesse Fabry-Pérot nature of the dielectric wafer, whose optical thickness depends on temperature due to two characteristics of the dielectric material: the linear expansion coefficient and the thermo-optic coefficient. For the used glass wafer with a refractive index of 1.5183 and a thickness of 15.75 mm, the temperature distance between adjacent interference peaks was 1.4825°C, which made it possible to measure the temperature with a mean accuracy of 0.005°C. Performance aspects of the proposed temperature sensor and its practical applicability are analyzed.
ISSN:1068-3372
1934-9378
DOI:10.3103/S106833722103004X