Advancements in thermal runaway process monitoring: Exploring a novel residual dissimilarity-based Kernel independent component analysis method - Li, Simin; Yang, Shuang-hua; Cao, Yi; Jiang, Xiaoping; Zhou, Chenchen (Computers & chemical engineering, 2025)
Keywords: Incipient fault detection; Kernel independent component analysis; Residual dissimilarity; Thermal runaway; Kernel independent component analysis; Residual dissimilarity; Thermal runaway; Incipient fault detection