Characterization of Cr implanted GaAs processed with ArF and Nd-YAG laser melting
We present a detailed investigation on the properties of supersaturated GaAs using Cr implantation followed by nanosecond pulsed laser melting (PLM). A comparison between two different lasers was carried out (ArF and Nd:YAG). We have analyzed supersaturated samples by means of structural, electrical...
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Published in | Semiconductor science and technology Vol. 40; no. 5; pp. 55008 - 55020 |
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Main Authors | , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
IOP Publishing
30.05.2025
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Subjects | |
Online Access | Get full text |
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