Rotatable Inductive Probe in Waveguides

It is shown by calculation of the field distribution in waveguides with TE waves in the presence of both the forward and the reflected waves that the voltage induced in a pure inductive probe depends on its angular position in the same manner that a probe in a slotted line depends on its axial posit...

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Bibliographic Details
Published inProceedings of the IRE Vol. 43; no. 8; pp. 974 - 980
Main Author Tischer, F. J.
Format Journal Article
LanguageEnglish
Published IEEE 01.01.1955
Subjects
Apertures
Detectors
Electrooptical waveguides
Magnetic field measurement
Probes
Rectangular waveguides
Tellurium
Voltage
Waveguide components
Wire
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Summary:It is shown by calculation of the field distribution in waveguides with TE waves in the presence of both the forward and the reflected waves that the voltage induced in a pure inductive probe depends on its angular position in the same manner that a probe in a slotted line depends on its axial position. Thus, a rotatable probe consisting of a wire loop and a compensating arrangement extending through an aperture into the waveguide can be used as a standing wave detector. An instrument for S-band waveguides utilizing this principle, its advantages and disadvantages and its error are further subjects of this paper.
ISSN:0096-8390
2162-6634
DOI:10.1109/JRPROC.1955.278205