Crystallochemical, Structural and Surface-active Properties of (ZnTe)x(CdSe)1-x Semi-conductor Devices
X-ray, IR-spectroscopic and electron-microscopic studies were conducted with the use of modern techniques. Moreover, the estimation of acid-base properties of the obtained (due to developed technique) solid solutions of ZnTe – CdSesystem was undertaken as well. They have been certified as the solid...
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Published in | Procedia engineering Vol. 113; pp. 456 - 460 |
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Main Authors | , |
Format | Journal Article |
Language | English |
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Elsevier Ltd
2015
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Abstract | X-ray, IR-spectroscopic and electron-microscopic studies were conducted with the use of modern techniques. Moreover, the estimation of acid-base properties of the obtained (due to developed technique) solid solutions of ZnTe – CdSesystem was undertaken as well. They have been certified as the solid substitution solutions with a sphalerite or wurtzite structure depending on the composition. The ultimate composition, the average particles size, specific area and acid areas strength (pHiso) were determined.
Some definite laws were found in bulk and surface properties changes. Specialattentionshouldbepaidtotheextreme, secularlyreflectedchanges of the number of the definite sized particles and pHiso, which are logically predetermined by the coordinative unsaturation change of the surface atoms as the active sites.
Thesolidsolutionsofthe “extremecompositions” are recommended for production of rapid-response analyzers for the basic gases micro-impurities. |
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AbstractList | X-ray, IR-spectroscopic and electron-microscopic studies were conducted with the use of modern techniques. Moreover, the estimation of acid-base properties of the obtained (due to developed technique) solid solutions of ZnTe – CdSesystem was undertaken as well. They have been certified as the solid substitution solutions with a sphalerite or wurtzite structure depending on the composition. The ultimate composition, the average particles size, specific area and acid areas strength (pHiso) were determined.
Some definite laws were found in bulk and surface properties changes. Specialattentionshouldbepaidtotheextreme, secularlyreflectedchanges of the number of the definite sized particles and pHiso, which are logically predetermined by the coordinative unsaturation change of the surface atoms as the active sites.
Thesolidsolutionsofthe “extremecompositions” are recommended for production of rapid-response analyzers for the basic gases micro-impurities. |
Author | Kirovskaya, I.A. Vasina, M.V. |
Author_xml | – sequence: 1 givenname: I.A. surname: Kirovskaya fullname: Kirovskaya, I.A. email: phiscem@omgtu.ru – sequence: 2 givenname: M.V. surname: Vasina fullname: Vasina, M.V. |
BookMark | eNp9kM9LwzAYhoNMcM79Bx563MDWJE2a9SLI_AkDhc6Ll5AmXzSja0bSje2_t2MePPld3u_yPrw8l2jQ-hYQuiY4I5gUt6tsEzy0XxnFhGdYZHnOz9CQzIRIBeazwZ__Ao1jXOHjCUw5GSI7D4fYqabx-hvWTqvmJqm6sNXdNqgmUa1Jqm2wSkOqdOd2kLwHv4HQOYiJt8nks13CdD-ZmwqmJN0nVU9JtW9Nj_AheYCd0xCv0LlVTYTxb47Qx9Pjcv6SLt6eX-f3i1TTQvCU1TUTBWU0t2RmytKAyQFyYykTtCiLWitWMF4LDKWuS86AW0KYoXnJAUqRjxA7cXXwMQawchPcWoWDJFgedcmVPOmSR10SC9nr6mt3pxr023YOgozaQavBuAC6k8a7_wE_MJF3eA |
CitedBy_id | crossref_primary_10_1134_S1027451021020233 |
Cites_doi | 10.1109/Dynamics.2014.7005665 |
ContentType | Journal Article |
Copyright | 2015 |
Copyright_xml | – notice: 2015 |
DBID | 6I. AAFTH AAYXX CITATION |
DOI | 10.1016/j.proeng.2015.07.335 |
DatabaseName | ScienceDirect Open Access Titles Elsevier:ScienceDirect:Open Access CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1877-7058 |
EndPage | 460 |
ExternalDocumentID | 10_1016_j_proeng_2015_07_335 S1877705815016100 |
GroupedDBID | --K 0R~ 0SF 1B1 4.4 457 5VS 6I. 71M AACTN AAEDT AAEDW AAFTH AAFWJ AAIKJ AALRI AAQFI AAXUO ABMAC ACGFS ADBBV ADEZE ADMUD AEXQZ AFTJW AGHFR AITUG ALMA_UNASSIGNED_HOLDINGS AMRAJ E3Z EBS EJD EP3 FDB FEDTE FNPLU HVGLF HZ~ IXB KQ8 M41 M~E NCXOZ O-L O9- OK1 OZT P2P RIG ROL SES SSZ XH2 AAYXX ADVLN AKRWK CITATION |
ID | FETCH-LOGICAL-c2675-4bb4762423f18d99ded3ee3df2472696bca4645b70e9cb954e5f114d2395ee973 |
IEDL.DBID | IXB |
ISSN | 1877-7058 |
IngestDate | Fri Aug 23 00:31:39 EDT 2024 Fri Feb 23 02:24:20 EST 2024 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Keywords | ultimate composition solid solutions laws semi-conductors physicochemical properties structure |
Language | English |
License | http://creativecommons.org/licenses/by-nc-nd/4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c2675-4bb4762423f18d99ded3ee3df2472696bca4645b70e9cb954e5f114d2395ee973 |
OpenAccessLink | https://www.sciencedirect.com/science/article/pii/S1877705815016100 |
PageCount | 5 |
ParticipantIDs | crossref_primary_10_1016_j_proeng_2015_07_335 elsevier_sciencedirect_doi_10_1016_j_proeng_2015_07_335 |
PublicationCentury | 2000 |
PublicationDate | 2015 2015-00-00 |
PublicationDateYYYYMMDD | 2015-01-01 |
PublicationDate_xml | – year: 2015 text: 2015 |
PublicationDecade | 2010 |
PublicationTitle | Procedia engineering |
PublicationYear | 2015 |
Publisher | Elsevier Ltd |
Publisher_xml | – name: Elsevier Ltd |
References | CdB Gouldstein (bib0015) 1984 I.A. Kirovskaya and et. , Patterns in acid-base property changes of oxides and chalcogenides surfaces - ZnB analogues. Conf. on Dyn. of Sys., Mech. and Mach. Dynam. 2014. Proc. Omsk: Omsk State Tech. Univ. Russia, Omsk, November11-13,2014. DOI:10.1109/Dynamics.2014.7005665. Kirovskaya (bib0005) 2010 Gorelik (bib0010) 1970 Gorelik (10.1016/j.proeng.2015.07.335_bib0010) 1970 Kirovskaya (10.1016/j.proeng.2015.07.335_bib0005) 2010 10.1016/j.proeng.2015.07.335_bib0020 Gouldstein (10.1016/j.proeng.2015.07.335_bib0015) 1984 |
References_xml | – start-page: 107 year: 1970 ident: bib0010 article-title: Rengenograficheskij i jelektronoopticheskij analiz publication-title: M.: Metallurgija contributor: fullname: Gorelik – start-page: 400 year: 2010 ident: bib0005 article-title: Tverdye rastvory binarnyh i mnogokomponentnyh poluprovodnikovyh sistem publication-title: Omsk: OmGTU contributor: fullname: Kirovskaya – start-page: 303 year: 1984 ident: bib0015 article-title: Rastrovaja jelektronnaja mikroskopija i rentgenovskij mikroanaliz: v dvuh knigah publication-title: M., Mir contributor: fullname: Gouldstein – start-page: 107 year: 1970 ident: 10.1016/j.proeng.2015.07.335_bib0010 article-title: Rengenograficheskij i jelektronoopticheskij analiz publication-title: M.: Metallurgija contributor: fullname: Gorelik – start-page: 303 year: 1984 ident: 10.1016/j.proeng.2015.07.335_bib0015 article-title: Rastrovaja jelektronnaja mikroskopija i rentgenovskij mikroanaliz: v dvuh knigah publication-title: M., Mir contributor: fullname: Gouldstein – ident: 10.1016/j.proeng.2015.07.335_bib0020 doi: 10.1109/Dynamics.2014.7005665 – start-page: 400 year: 2010 ident: 10.1016/j.proeng.2015.07.335_bib0005 article-title: Tverdye rastvory binarnyh i mnogokomponentnyh poluprovodnikovyh sistem publication-title: Omsk: OmGTU contributor: fullname: Kirovskaya |
SSID | ssj0000070251 |
Score | 2.0393448 |
Snippet | X-ray, IR-spectroscopic and electron-microscopic studies were conducted with the use of modern techniques. Moreover, the estimation of acid-base properties of... |
SourceID | crossref elsevier |
SourceType | Aggregation Database Publisher |
StartPage | 456 |
SubjectTerms | laws physicochemical properties semi-conductors solid solutions structure ultimate composition |
Title | Crystallochemical, Structural and Surface-active Properties of (ZnTe)x(CdSe)1-x Semi-conductor Devices |
URI | https://dx.doi.org/10.1016/j.proeng.2015.07.335 |
Volume | 113 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEA6LJz2IT3yTg4ddMGybpI8ctSqLoAjdhcVLSZOprCxdWRT04m83k7aiIB68FFo6pUzKl_mmM98QciqsMUJazdLUBEwqWTHtwnjGY4iBa54G4Kst7uLRRN5Mo2mPZF0vDJZVttjfYLpH6_bKsPXm8Hk2G-YhStkFUepCGhe2BMjbRRT6Jr7pxVeeBfVsuJ_CiPczNOg66HyZl8MpqB-xxitCFU_h5779skN923WuN8h6Gy7S8-aNNkkP6i2y9k1EcJtU2fLdhXjzOc6-8s3_ZzT3qrCoqEF1bWn-uqy0AaY9uNF7TMAvUUmVLiraf6jHMHjrZzaHQcjeaO6ewhxNRiXYxZJeggeTHTK5vhpnI9ZOT2CGOxbAZFnKBLs_RBWmVikLVgAIW3GZ8FjFpdH4V7NMAlCmVJGEqHLkyHKhIgCViF2yUi9q2CNUOFIBsZYCCZVECX4VmyDiJtBp6TjRPmGdx4rnRiSj6KrHnorGwwV6uAiSwnl4nySdW4sfi104HP_T8uDflodkFc-a7MkRWXHrAMcunngpT_wH4463H1efrOLIsg |
link.rule.ids | 315,783,787,3513,4031,27935,27936,27937,45886 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEA6iB_UgPvFtDh4UDNtN0keOuirrE6ErLF5CmkxlRbqyKOi_N5O2oiAevLZMKJPwZb7pzDeE7AtnrZDOsCyzEZNKlsz4MJ7xBBLghmcRhGqL26R_Ly-H8XCK9NpeGCyrbLC_xvSA1s2TTuPNzsto1Mm7KGUXxZkPaXzYEnnePoNtl3jML4YnX4kWFLThYQwjGjC0aFvoQp2XByqoHrHIK0YZTxEGv_1yRX27ds4XyUITL9Lj-pOWyBRUy2T-m4rgCil7kw8f4z0_4_Cr0P1_RPMgC4uSGtRUjuZvk9JYYCagG73DDPwEpVTpuKQHD9UADt8Pei6Hwy57p7lfhXmejFKw4wk9hYAmq-T-_GzQ67NmfAKz3NMAJotCptj-Icpu5pRy4ASAcCWXKU9UUliDvzWLNAJlCxVLiEvPjhwXKgZQqVgj09W4gnVChWcVkBgpkFFJ1OBXiY1ibiOTFZ4UbRDWeky_1CoZui0fe9K1hzV6WEep9h7eIGnrVv1jt7UH8j8tN_9tuUdm-4Oba319cXu1RebwTZ1K2SbTfk9gxwcXr8VuODyfNjTKrw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Crystallochemical%2C+Structural+and+Surface-active+Properties+of+%28ZnTe%29x%28CdSe%291-x+Semi-conductor+Devices&rft.jtitle=Procedia+engineering&rft.au=Kirovskaya%2C+I.A.&rft.au=Vasina%2C+M.V.&rft.date=2015&rft.issn=1877-7058&rft.eissn=1877-7058&rft.volume=113&rft.spage=456&rft.epage=460&rft_id=info:doi/10.1016%2Fj.proeng.2015.07.335&rft.externalDBID=n%2Fa&rft.externalDocID=10_1016_j_proeng_2015_07_335 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1877-7058&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1877-7058&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1877-7058&client=summon |